Published May 2019 | Version v1
Journal article

High-energy industrial 2D X-ray imaging system with effective nonlocal means denoising for nondestructive testing

  • 1. Department of Radiological Science, Konyang University, 158 Gwanjeodong-ro, Daejeon (Korea, Republic of)
  • 2. OSONG Medical Innovation Foundation Laboratory Animal Center, Osong saengmyeong-ro 123, Osong-eup, Heungdeok-gu, Cheongju-si, Chungbuk (Korea, Republic of)
  • 3. Department of Radiological Science, Gachon University, 191, Hambakmoero, Yeonsu-gu, Incheon (Korea, Republic of)

Description

High-energy industrial X-ray imaging systems are widely used in the field of nondestructive testing for the detection of defects in mechanical material. To improve the defect detection ratio, it is highly important to reduce the amount of noise in this process. The purpose of this study is to develop a nonlocal means denoising algorithm in order to evaluate noise characteristics in a 450 kVp high-energy industrial X-ray imaging system. The analysis approach is tested on two phantom images, and image performance is evaluated by visual assessment, as well as the normalized noise power spectrum, contrast to noise ratio, and coefficient of variation. Improvement in image performance is attributed to the use of NLM denoising algorithm on high-energy industrial X-ray images, and results demonstrate that the proposed algorithm effectively reduces image noise.

Additional details

Identifiers

DOI
10.1016/j.nima.2019.01.060;
PII
S0168900219301172;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
925
Journal Page Range
p. 212-216
ISSN
0168-9002
CODEN
NIMAER

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
55021221
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
ALGORITHMS; DEFECTS; IMAGES; NOISE; NONDESTRUCTIVE TESTING; PERFORMANCE; PHANTOMS; RADIATION DETECTION; SPECTRA; X RADIATION
Descriptors DEC
DETECTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MATERIALS TESTING; MATHEMATICAL LOGIC; MOCKUP; RADIATIONS; STRUCTURAL MODELS; TESTING

Optional Information

Copyright
Copyright (c) 2019 Elsevier B.V. All rights reserved.