High-energy industrial 2D X-ray imaging system with effective nonlocal means denoising for nondestructive testing
Creators
- 1. Department of Radiological Science, Konyang University, 158 Gwanjeodong-ro, Daejeon (Korea, Republic of)
- 2. OSONG Medical Innovation Foundation Laboratory Animal Center, Osong saengmyeong-ro 123, Osong-eup, Heungdeok-gu, Cheongju-si, Chungbuk (Korea, Republic of)
- 3. Department of Radiological Science, Gachon University, 191, Hambakmoero, Yeonsu-gu, Incheon (Korea, Republic of)
Description
High-energy industrial X-ray imaging systems are widely used in the field of nondestructive testing for the detection of defects in mechanical material. To improve the defect detection ratio, it is highly important to reduce the amount of noise in this process. The purpose of this study is to develop a nonlocal means denoising algorithm in order to evaluate noise characteristics in a 450 kVp high-energy industrial X-ray imaging system. The analysis approach is tested on two phantom images, and image performance is evaluated by visual assessment, as well as the normalized noise power spectrum, contrast to noise ratio, and coefficient of variation. Improvement in image performance is attributed to the use of NLM denoising algorithm on high-energy industrial X-ray images, and results demonstrate that the proposed algorithm effectively reduces image noise.
Additional details
Identifiers
- DOI
- 10.1016/j.nima.2019.01.060;
- PII
- S0168900219301172;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 925
- Journal Page Range
- p. 212-216
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55021221
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- ALGORITHMS; DEFECTS; IMAGES; NOISE; NONDESTRUCTIVE TESTING; PERFORMANCE; PHANTOMS; RADIATION DETECTION; SPECTRA; X RADIATION
- Descriptors DEC
- DETECTION; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MATERIALS TESTING; MATHEMATICAL LOGIC; MOCKUP; RADIATIONS; STRUCTURAL MODELS; TESTING
Optional Information
- Copyright
- Copyright (c) 2019 Elsevier B.V. All rights reserved.