Published February 1994 | Version v1
Journal article

Anisotropy of flux line activation energy in Nd2-xCexCuO4 thin film

  • 1. Dept. of Physics, Kyushu Univ., Fukuoka (Japan)
  • 2. NTT Interdisciplinary Research Labs., Nippon Telegraph and Telephone Corp., Ibaraki (Japan)

Description

Using Nd2-xCexCuO4 (NCC) film prepared by the reactive co-evaporation technique, we measured the temperature dependence of resistivity in the mixed state as a function of the direction of magnetic field from the basal plane. The activation energy at 0 K depended mainly on the c-axis component of the field, but the basal component also seems to give a small contribution. This suggests that the appearance of the voltage in the mixed state is determined mainly by flux lines parallel to the c-axis. (orig.)

Additional details

Publishing Information

Journal Title
Physica. B, Condensed Matter
Journal Volume
194-196
Journal Page Range
p. 2359-2360.
ISSN
0921-4526
CODEN
PHYBE3

Conference

Title
20. IUPAP international conference on low temperature physics (LT-20).
Dates
4-11 Aug 1993.
Place
Eugene, OR (United States).