Published April 15, 2001
| Version v1
Journal article
Enhancement in PIXE analysis
Description
The enhancement in proton induced X-ray emission analysis (PIXE) due to secondary excitation by bremsstrahlung, secondary electrons, target-target collisions, Auger electrons and primary induced X-rays is discussed. Primary induced X-rays are concluded to be the only source of importance. The enhancement is investigated as a function of proton energy and sample thickness, and the calculated values are shown to be within 5% agreement with experimental results obtained from a NBS Standard Steel sample. (Auth.)
Additional details
Publishing Information
- Journal Title
- Nucl. Instrum. Methods
- Journal Volume
- 142
- Journal Issue
- 1-2
- Series
- Nucl. Instrum. Methods.
- Journal Page Range
- 61-65
Conference
- Title
- International conference on particle induced X-ray emission and its analytical applications.
- Dates
- 23 - 26 Aug 1976.
- Place
- Lund, Sweden.
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 8327447
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; CORRECTIONS; CROSS SECTIONS; ENERGY DEPENDENCE; ENERGY LOSSES; EXCITATION; FLUORESCENCE; IONIZATION; MULTI-ELEMENT ANALYSIS; PROTON BEAMS; SECONDARY EMISSION; STOPPING POWER; TARGETS; THICKNESS; X RADIATION; X-RAY EMISSION ANALYSIS
- Descriptors DEC
- BEAMS; CHEMICAL ANALYSIS; DIMENSIONS; ELECTROMAGNETIC RADIATION; EMISSION; ENERGY-LEVEL TRANSITIONS; IONIZING RADIATIONS; LUMINESCENCE; NONDESTRUCTIVE ANALYSIS; NUCLEON BEAMS; PARTICLE BEAMS; RADIATIONS