Plasma-induced frequency shifts in microwave beams
Creators
- 1. Tennessee Univ., Knoxville, TN (United States)
Description
The authors have been investigating microwave frequency shifts by two different processes. In the first, a microwave beam is reflected from a plasma jet produced by a Bostic gun. Frequency upshifts of about four MHz are produced on a beam at 3 GHz. The reflected signal at 3GHz is observed to drop in intensity during this process by about 30 dB. In the second process, microwaves are propagated through a waveguide in which plasma is suddenly created by a pulsed electrical discharge. Since the phase velocity is a plasma is higher than in a vacuum, we might expect the microwaves to be ejected from the plasma, producing a frequency upshift. Experimentally, we find that a frequency upshift of over 10 MHz in a signal of 2.6 GHZ is routinely observed, as shown. An interesting observation is that a frequency downshift is observed. This frequency downshift appears only in a system at low gas pressure, less than 10-4 Torr, and occurs later in time than the frequency upshift. The authors suspect that it is the result of plasma decay, and is the inverse of our second process described above
Additional details
Publishing Information
- Publisher
- IEEE Service Center.
- Imprint Place
- Piscataway, NJ (USA)
- Imprint Title
- 1990 IEEE international conference on plasma science-Conference Record-Abstracts
- Imprint Pagination
- 231 p.
- Journal Page Range
- p. 171.
Conference
- Title
- 17. IEEE international conference on plasma science (ICOPS 17).
- Dates
- 21-23 May 1990.
- Place
- Oakland, CA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22074469
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ELECTRIC DISCHARGES; HIGH VACUUM; MICROWAVE RADIATION; PLASMA GUNS; PLASMA JETS; REFLECTION; SPECTRAL SHIFT; WAVE PROPAGATION
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; RADIATIONS
Optional Information
- Secondary number(s)
- CONF-900585--.