Multivariate analysis method for energy calibration and improved mass assignment in recoil spectrometry
Creators
- 1. Department of Nuclear Physics, Lund Institute of Technology, Soelvegatan 14, S-223 62 Lund (Sweden)
- 2. Department of Inorganic Chemistry, Uppsala University, Box 531, S-751 21 Uppsala (Sweden)
- 3. Department of Electronics, Solid State Electronics, Royal Institute of Technology, P.O. Box Electrum 229, S-164 40 Kista (Sweden)
- 4. Australian Nuclear Science and Technology Organisation, PMB 1, Menai 2234, Lucas Heights (Australia)
- 5. Department of Applied Physics, Royal Melbourne Institute of Technology, GPO Box 2476V, Melbourne 3001 (Australia)
Description
Heavy ion recoil spectrometry is rapidly becoming a well established analysis method, but the associated data analysis processing is still not well developed. The pronounced nonlinear response of silicon detectors for heavy ions leads to serious limitation and complication in mass gating, which is the principal factor in obtaining energy spectra with minimal cross talk between elements. To overcome the above limitation, a simple empirical formula with an associated multiple regression method is proposed for the absolute energy calibration of the time of flight-energy dispersive detector telescope used in recoil spectrometry. A radical improvement in mass assignment was realized, which allows a more accurate and improved depth profiling with the important feature of making the data processing much easier. ((orig.))
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 94
- Journal Issue
- 4
- Journal Page Range
- p. 530-536.
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 26030685
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- CALIBRATION; DEPTH; ENERGY LOSSES; HEAVY IONS; IODINE IONS; IODINE 127 BEAMS; ION COLLISIONS; ION DETECTION; ION SPECTROSCOPY; MASS SPECTROSCOPY; MEV RANGE 10-100; MULTICHARGED IONS; MULTIVARIATE ANALYSIS; RECOILS; REGRESSION ANALYSIS; SI SEMICONDUCTOR DETECTORS; SPATIAL DISTRIBUTION; SPECTRA UNFOLDING; SURFACE BARRIER DETECTORS; TELESCOPE COUNTERS; TIME-OF-FLIGHT METHOD
- Descriptors DEC
- BEAMS; CHARGED PARTICLE DETECTION; CHARGED PARTICLES; COLLISIONS; DATA PROCESSING; DETECTION; DIMENSIONS; DISTRIBUTION; ENERGY RANGE; ION BEAMS; IONS; MATHEMATICS; MEASURING INSTRUMENTS; MEV RANGE; RADIATION DETECTION; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS; SPECTROSCOPY; STATISTICS