Published November 17, 2010 | Version v1
Journal article Metadata-only

Suppressed magnetoelectric effect in epitaxially grown multiferroic Pb(Zr0.57Ti0.43)O3-Pb(Fe2/3W1/3)O3 solid-solution thin films

Creators

  • 1. ReCFI, Department of Physics and Astronomy, Seoul National University, Seoul 151-747 (Korea, Republic of)
  • 2. Department of Physics, Inha University, Inchon 402-751 (Korea, Republic of)
  • 3. School of Nano and Advanced Materials Engineering, Changwon National University, Changwon 641-773 (Korea, Republic of)
  • 4. Division of Materials Science, Korea Basic Science Institute, Daejeon 305-333 (Korea, Republic of)

Description

We report on the epitaxial growth of single-phase [Pb(Zr0.57Ti0.43)O3]0.8[Pb(Fe2/3W1/3)O3]0.2 (PZT-PFW) solid-solution thin films using pulsed laser deposition. X-ray diffraction measurements reveal that the films have a tetragonal structure. The films exhibit ferroelectric properties and weak ferromagnetic responses at room temperature. The magnetoelectric effects were investigated; the nonlinear magnetocapacitance coefficient, β33, was measured and found to be comparable to those of multiferroic hexagonal manganites, but at least two orders of magnitude smaller than that for polycrystalline PZT-PFW films.

Availability note (English)

Available from http://dx.doi.org/10.1088/0022-3727/43/45/455403

Additional details

Identifiers

DOI
10.1088/0022-3727/43/45/455403;
PII
S0022-3727(10)63213-5;

Publishing Information

Journal Title
Journal of Physics. D, Applied Physics
Journal Volume
43
Journal Issue
45
Journal Page Range
[6 p.]
ISSN
0022-3727
CODEN
JPAPBE

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42068614
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ELECTRICAL PROPERTIES; ENERGY BEAM DEPOSITION; EPITAXY; FERROELECTRIC MATERIALS; IRON OXIDES; LASER RADIATION; LEAD TUNGSTATES; MAGNETIC PROPERTIES; NONLINEAR PROBLEMS; POLYCRYSTALS; PULSED IRRADIATION; PZT; SOLID SOLUTIONS; TEMPERATURE RANGE 0273-0400 K; THIN FILMS; X-RAY DIFFRACTION
Descriptors DEC
CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; CRYSTALS; DEPOSITION; DIELECTRIC MATERIALS; DIFFRACTION; DISPERSIONS; ELECTROMAGNETIC RADIATION; FILMS; HOMOGENEOUS MIXTURES; IRON COMPOUNDS; IRRADIATION; LEAD COMPOUNDS; MATERIALS; MIXTURES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; REFRACTORY METAL COMPOUNDS; SCATTERING; SOLUTIONS; SURFACE COATING; TEMPERATURE RANGE; TITANATES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS; TUNGSTATES; TUNGSTEN COMPOUNDS; ZIRCONATES; ZIRCONIUM COMPOUNDS