Published April 2010
| Version v1
Journal article
The effect of dynamical scattering in off-axis holographic mean inner potential and inelastic mean free path measurements
Creators
- 1. Triebenberg Laboratory, Institute of Structure Physics, Technische Universitaet Dresden, 01062 Dresden (Germany)
Description
A detailed analysis of the influence of dynamical scattering in medium-resolution off-axis electron holography yields a systematic underestimation of mean inner potentials derived by means of the phase grating approximation. The deviations are categorized with respect to the specimen thickness and the scattering potential. Approximate and easy to use correction formulas valid for arbitrary materials of very small (several atomic layers) or large thicknesses are derived. It is additionally found that incorporation of thermal motion in elastic scattering theory leads to damping terms in the reconstructed amplitude, which have to be added to the previously considered damping due to inelastic scattering.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2009.09.009Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2009.09.009;
- PII
- S0304-3991(09)00205-8;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 110
- Journal Issue
- 5
- Journal Page Range
- p. 438-446
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44102724
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- APPROXIMATIONS; CORRECTIONS; DAMPING; ELASTIC SCATTERING; ELECTRONS; HOLOGRAPHY; INELASTIC SCATTERING; LAYERS; MEAN FREE PATH; POTENTIALS; RESOLUTION; SCATTERING AMPLITUDES
- Descriptors DEC
- AMPLITUDES; CALCULATION METHODS; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; SCATTERING
Optional Information
- Copyright
- Copyright (c) 2009 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.