Published October 1, 2007 | Version v1
Journal article

Electrical contact characteristics of YBaCuO bulk

  • 1. Department of System Design Engineering, Faculty of Science and Technology, Keio University, 3-14-1 Hiyoshi, Kohoku-ku, Yokohama 223-8522 (Japan)
  • 2. Railway Technical Research Institute, 2-8-38 Hikari-cho, Kokubunji, Tokyo 185-8540 (Japan)
  • 3. ISTEC-Superconductivity Research Laboratory, 1-10-13 Shinonome, Koto-ku, Tokyo 135-0062 (Japan)
  • 4. Shibaura Institute of Technology, 3-9-14 Shibaura, Minato-ku, Tokyo 108-8548 (Japan)

Description

A persistent current switch (PCS) is used for superconducting applications, such as superconducting magnetic energy storage (SMES) system. The authors have proposed a mechanical switch of Y-Ba-Cu-O (YBCO) bulk as a mechanical PCS. In previous study, in order to investigate the contact characteristics of switch, 50 A current test was performed and the contact resistance between two contacts was measured by four-terminal method. As a result, it became clear that polishing and metal depositing on contact surfaces was effective methods to reduce the residual resistance. This paper focused on the greater current test (above 50 A) in order to perform more practical experiment as PCS used for SMES. In this experiment, the authors examined the characteristics to the transfer current of switch, which was not obtained by former 50 A current test. As a result, it was obtained that the transfer current had a relationship with the layer thickness of deposited Ag on contact surfaces

Availability note (English)

Available from http://dx.doi.org/10.1016/j.physc.2007.04.307

Additional details

Identifiers

DOI
10.1016/j.physc.2007.04.307;
PII
S0921-4534(07)01037-4;

Publishing Information

Journal Title
Physica. C, Superconductivity
Journal Volume
463-465
Journal Page Range
p. 1361-1364
ISSN
0921-4534
CODEN
PHYCE6

Conference

Title
19. international symposium on superconductivity
Acronym
ISS 2006
Dates
30 Oct - 1 Nov 2006
Place
Nagoya (Japan)

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.