Stress measurements in nanocrystalline Ni electrodeposits
Creators
- 1. Dofasco Inc., P.O. Box 2460, Hamilton, Ontario, L8N 3J5 (Canada)
- 2. Faculty of Engineering and Applied Science, Memorial University of Newfoundland, St. John's, Newfoundland, A1B 3X5 (Canada)
- 3. Department of Metallurgy and Materials Science, University of Toronto, Toronto, Ontario, M5S 3E4 (Canada)
Description
X-ray diffraction method was used to assess the internal stresses in nanocrystalline nickel coatings electrodeposited onto various substrates. In addition, internal stresses in nanocrystalline nickel deposits without substrates were also investigated using the same technique. The preferred orientation of nanocrystalline nickel deposits was found unaffected by substrate type and bath addition. All deposits showed that compressive internal stresses are present. The substrate type was found to affect the magnitude of internal stresses in these deposits. Furthermore, compared with microcrystalline coatings, the nanoprocessed deposits contained higher compressive stresses. The addition of small amounts of sodium lauryl sulphonate to a saccharin-containing Watts' bath was found to decrease the internal stresses in deposits. It is concluded that nanoprocessed Ni-coatings are strong contenders for applications requiring high fatique strength of the underlying substrate metal
Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2004.08.010;
- PII
- S0925-8388(04)01015-1;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 389
- Journal Issue
- 1-2
- Journal Page Range
- p. 140-143
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37039422
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- COATINGS; CRYSTALS; DEPOSITS; ELECTRODEPOSITION; GRAIN ORIENTATION; NANOSTRUCTURES; NICKEL; STRESSES; SUBSTRATES; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; DEPOSITION; DIFFRACTION; ELECTROLYSIS; ELEMENTS; LYSIS; METALS; MICROSTRUCTURE; ORIENTATION; SCATTERING; SURFACE COATING; TRANSITION ELEMENTS
Optional Information
- Copyright
- Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.