Published June 2016 | Version v1
Journal article Metadata-only

Electron density change of atmospheric-pressure plasmas in helium flow depending on the oxygen/nitrogen ratio of the surrounding atmosphere

Creators

  • 1. Kyushu University, Interdisciplinary Graduate School of Engineering and Sciences, Kasuga, Fukuoka (Japan)
  • 2. Tokyo University, Graduate School of Frontier Sciences, Kashiwa, Chiba (Japan)
  • 3. Tokyo Metropolitan University, Graduate School of Science and Engineering, Hachioji, Tokyo (Japan)
  • 4. Faculty of Science, Al-Azhar University, Cairo (Egypt)

Description

Laser Thomson scattering was applied to an atmospheric-pressure plasma produced in a helium (He) gas flow for measuring the spatial profiles of electron density (ne) and electron temperature (Te). Aside from the He core flow, the shielding gas flow of N2 or synthesized air (N2 : O2 = 4 : 1) surrounding the He flow was introduced to evaluate the effect of ambient gas components on the plasma parameters, eliminating the effect of ambient humidity. The ne at the discharge center was 2.7 × 1021 m-3 for plasma generated with N2/O2 shielding gas, 50% higher than that generated with N2 shielding. (author)

Availability note (English)

Available from http://dx.doi.org/10.7567/JJAP.55.066101

Additional details

Identifiers

DOI
10.7567/JJAP.55.066101;

Publishing Information

Journal Title
Japanese Journal of Applied Physics
Journal Volume
55
Journal Issue
6
Journal Page Range
p. 066101.1-066101.5
ISSN
0021-4922

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
48005543
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Descriptors DEI
ELECTRODES; ELECTRON DENSITY; ELECTRON TEMPERATURE; HELIUM; IMPURITIES; LASERS; QUANTUM EFFICIENCY; RAMAN SPECTRA; RESISTORS; SHIELDING MATERIALS; THOMSON SCATTERING; TRANSISTORS
Descriptors DEC
EFFICIENCY; ELECTRICAL EQUIPMENT; ELEMENTS; EQUIPMENT; FLUIDS; GASES; INELASTIC SCATTERING; MATERIALS; NONMETALS; RARE GASES; SCATTERING; SEMICONDUCTOR DEVICES; SPECTRA

Optional Information

Notes
34 refs., 8 figs., 1 tab.