Published May 22, 1984 | Version v1
Patent

Plasma etch chemistry for anisotropic etching of silicon

Creators

Description

A plasma etch chemistry which allows a near perfectly vertical etch of silicon is disclosed. A Cl-containing compound such as BCl3 has Br2 added to it, readily allowing anisotropic etching of silicon. This is due to the low volatility of SiBr4. The silicon surface facing the discharge is subjected to ion bombardment, allowing the volatilization (etching) of silicon as a Si-Cl-Br compound. The Br which adsorbs on the sidewalls of the etched silicon protects them from the etching. This new plasma etch chemistry yields a very smooth etched surface, and the etch rate is relatively insensitive to the electrical conductivity of the silicon

Availability note (English)

U.S. Commissioner of Patents, Washington, D.C. 20231, USA, $.50.

Additional details

Publishing Information

Imprint Pagination
v p.
IPC:
Int. Cl. H01L 21/306.
IPC
Int. Cl. H01L 21/306.
Patent number
US patent document 4,450,042/A/

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
16049674
Subject category
S36: MATERIALS SCIENCE; S42: ENGINEERING;
Resource subtype / Literary indicator
Non-conventional Literature
Descriptors DEI
ADSORPTION; ANISOTROPY; BORON CHLORIDES; BROMINE COMPOUNDS; CHEMICAL REACTION KINETICS; CHLORINE COMPOUNDS; ELECTRIC CONDUCTIVITY; ETCHING; FABRICATION; ION BEAMS; PLASMA; SEMICONDUCTOR DEVICES; SILICON
Descriptors DEC
BEAMS; BORON COMPOUNDS; CHLORIDES; ELECTRICAL PROPERTIES; ELEMENTS; HALIDES; HALOGEN COMPOUNDS; KINETICS; PHYSICAL PROPERTIES; REACTION KINETICS; SEMIMETALS

Optional Information

Notes
PAT-APPL-395205.