Published May 22, 1984
| Version v1
Patent
Plasma etch chemistry for anisotropic etching of silicon
Creators
Description
A plasma etch chemistry which allows a near perfectly vertical etch of silicon is disclosed. A Cl-containing compound such as BCl3 has Br2 added to it, readily allowing anisotropic etching of silicon. This is due to the low volatility of SiBr4. The silicon surface facing the discharge is subjected to ion bombardment, allowing the volatilization (etching) of silicon as a Si-Cl-Br compound. The Br which adsorbs on the sidewalls of the etched silicon protects them from the etching. This new plasma etch chemistry yields a very smooth etched surface, and the etch rate is relatively insensitive to the electrical conductivity of the silicon
Availability note (English)
U.S. Commissioner of Patents, Washington, D.C. 20231, USA, $.50.Additional details
Publishing Information
- Imprint Pagination
- v p.
- IPC:
- Int. Cl. H01L 21/306.
- IPC
- Int. Cl. H01L 21/306.
- Patent number
- US patent document 4,450,042/A/
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 16049674
- Subject category
- S36: MATERIALS SCIENCE; S42: ENGINEERING;
- Resource subtype / Literary indicator
- Non-conventional Literature
- Descriptors DEI
- ADSORPTION; ANISOTROPY; BORON CHLORIDES; BROMINE COMPOUNDS; CHEMICAL REACTION KINETICS; CHLORINE COMPOUNDS; ELECTRIC CONDUCTIVITY; ETCHING; FABRICATION; ION BEAMS; PLASMA; SEMICONDUCTOR DEVICES; SILICON
- Descriptors DEC
- BEAMS; BORON COMPOUNDS; CHLORIDES; ELECTRICAL PROPERTIES; ELEMENTS; HALIDES; HALOGEN COMPOUNDS; KINETICS; PHYSICAL PROPERTIES; REACTION KINETICS; SEMIMETALS
Optional Information
- Notes
- PAT-APPL-395205.