Published March 2008 | Version v1
Journal article

The CMS Monte Carlo Production System: Development and Design

  • 1. Fermi National Accelerator Laboratory, Batavia, IL (United States)
  • 2. Universita degli Studi di Bologna and INFN Sezione di Bologna, Bologna (Italy)
  • 3. INFN Sezione di Trieste, Trieste (Italy)
  • 4. California Institute of Technology, Pasadena, CA (United States)
  • 5. Northeastern University, Boston, MA (United States)
  • 6. INFN Sezione di Bari, Bari (Italy)
  • 7. Centro de Investigaciones Energeticas, Medioambientales y Tecnologicas, Madrid (Spain)
  • 8. Princeton University, Princeton, NJ (United States)

Description

The CMS production system has undergone a major architectural upgrade from its predecessor, with the goal of reducing the operational manpower needed and preparing for the large scale production required by the CMS physics plan. The new production system is a tiered architecture that facilitates robust and distributed production request processing and takes advantage of the multiple Grid and farm resources available to the CMS experiment

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nuclphysbps.2008.02.001

Additional details

Identifiers

DOI
10.1016/j.nuclphysbps.2008.02.001;
PII
S0920-5632(08)00041-8;

Publishing Information

Journal Title
Nuclear Physics. B, Proceedings Supplements
Journal Volume
177-178
Journal Page Range
p. 285-286
ISSN
0920-5632
CODEN
NPBSE7

Conference

Title
Hadron collider physics symposium 2007
Dates
20-26 May 2007
Place
La Biodola, Elba (Italy)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39087783
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S72: PHYSICS OF ELEMENTARY PARTICLES AND FIELDS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CERN; COMPUTER ARCHITECTURE; DESIGN; MONTE CARLO METHOD; MUON DETECTION; PROCESSING; RADIATION DETECTORS; SIMULATION
Descriptors DEC
CALCULATION METHODS; CHARGED PARTICLE DETECTION; DETECTION; INTERNATIONAL ORGANIZATIONS; MEASURING INSTRUMENTS; RADIATION DETECTION

Optional Information

Copyright
Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.