Optical absorption in thin films of cerium dioxide and cerium dioxide containing silicon monoxide

The cerium dioxide has been studied in thin film form to determine the position of the absorption edge, its general shape, and the effects on the position of the edge of increasing the concentrations of silicon monoxide in the films. The CeO2 and the mixed oxide films of SiO and CeO2 were prepared by co-evaporation on different substrates. Optical absorption measurements, electron diffraction and electron microscopic studies were carried out. The effect on the absorbance curve of increasing the proportion of SiO (12 to 60% SiO) in the thin films is shown. The absorption levels are reduced and the edge becomes more diffuse. The value of optical energy gap is only slightly modified by addition of SiO