Published August 1, 2013
| Version v1
Journal article
New bi-dimensional SPAD arrays for time resolved single photon imaging
Creators
- 1. Centro Siciliano di Fisica Nucleare e Struttura della Materia, Viale A. Doria 6, 95125 Catania (Italy)
- 2. Dipartimento di Fisica ed Astronomia, Università di Catania, Via S. Sofia 64, 95123 Catania (Italy)
- 3. INFN-Laboratori Nazionali del Sud and Sez., INFN di Catania, Via S. Sofia 62, 95125 Catania (Italy)
- 4. FBK-Fondazione Bruno Kessler, Via S. Croce 77, 38122 Trento (Italy)
Description
Some of the first results concerning the electrical and optical performances of new bi-dimensional single photon avalanche diodes arrays for imaging applications are briefly presented. The planned arrays were realized at the Fondazione Bruno Kessler—Trento and tested at LNS–INFN. The proposed new solution, utilizing a new architecture with integrated quenching resistors, allows to simplify the electronic readout
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nima.2012.11.136Additional details
Identifiers
- DOI
- 10.1016/j.nima.2012.11.136;
- PII
- S0168-9002(12)01483-0;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 718
- Journal Page Range
- p. 566-568
- ISSN
- 0168-9002
- CODEN
- NIMAER
Conference
- Title
- 12. Pisa meeting on advanced detectors
- Dates
- 20-26 May 2012
- Place
- La Biodola, Elba (Italy)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45047971
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- PERFORMANCE; PHOTODIODES; PHOTONS; QUENCHING; READOUT SYSTEMS; RESISTORS; TIME RESOLUTION
- Descriptors DEC
- BOSONS; ELECTRICAL EQUIPMENT; ELEMENTARY PARTICLES; EQUIPMENT; MASSLESS PARTICLES; RESOLUTION; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TIMING PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2012 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.