Published February 2012
| Version v1
Journal article
Temperature dependence of the London penetration depth in Pr2CuO4 from millimeter-wave optical experiments
- 1. Dresden High Magnetic Field Laboratory (HLD), Helmholtz-Zentrum Dresden-Rossendorf, 01314 Dresden (Germany)
- 2. Department of Applied Physics, Tokyo University of Agriculture and Technology, Naka-cho 2-24-16, Koganei, Tokyo 184-8588 (Japan)
Description
We have investigated the in-plane penetration depth, λ(T), of nominally undoped superconducting Pr2CuO4 films (Tc = 27.5 K) by measuring the phase-sensitive millimeter-wave transmission at temperatures between 2 and 30 K. The overall temperature dependence of the superfluid density, ns = λ2(0 K)/λ2(T), resembles the behavior typical for the cuprate superconductors [ns(T) ∼1-(T/Tc)2]. However, a closer look on the penetration depth at low temperatures reveals flattening of its temperature dependence. We find λ(T)∼Tn with n = 2.8 ± 0.2.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.physc.2011.11.006Additional details
Identifiers
- DOI
- 10.1016/j.physc.2011.11.006;
- PII
- S0921-4534(11)00509-0;
Publishing Information
- Journal Title
- Physica. C, Superconductivity
- Journal Volume
- 473
- Journal Page Range
- p. 11-13
- ISSN
- 0921-4534
- CODEN
- PHYCE6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43086525
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CUPRATES; DECOMPOSITION; OPTICAL PROPERTIES; ORGANOMETALLIC COMPOUNDS; PENETRATION DEPTH; PRASEODYMIUM COMPOUNDS; SUPERCONDUCTORS; SUPERFLUIDITY; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0000-0013 K; TEMPERATURE RANGE 0013-0065 K; TRANSITION TEMPERATURE; TRANSMISSION
- Descriptors DEC
- CHEMICAL REACTIONS; COPPER COMPOUNDS; ORGANIC COMPOUNDS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RARE EARTH COMPOUNDS; TEMPERATURE RANGE; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.