Qualitative and Quantitative Characterization of Porosity in a Low Porous and Low Permeable Organic Rich Shale by Combining Broad Ion Beam and Scanning Electron Microscopy (BIB-SEM)
- 1. Structural Geology, Tectonics and Geomechanics, RWTH Aachen University (Germany)
Description
This contribution focuses on the characterization of porosity in low porous shale using a broad ion beam (BIB) polishing technique combined with a conventional scanning electron microscopy (SEM). Porosity was traced in certain representative elementary areas (REA) and pores detected are segmented from mosaics of secondary electron (SE) images. Traced pores could be classified into two major pore-size classes. Relative large pores (> 0.5 μm2) were found in the organic matter and matrix. They contribute strongly to the overall porosity con-tent of the shale. Nevertheless the far majority of the pores traced have equivalent radius less than 400 nm. Including the latter pore class, the imaged porosity from both samples gives similar results in the order of < 1 %. (authors)
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Additional details
Publishing Information
- Imprint Title
- Proceedings of the NEA Clay Club Workshop on Clay characterisation from nanoscopic to microscopic resolution
- Imprint Pagination
- 168 p.
- Journal Page Range
- p. 108-111
- Report number
- NEA-RWM-CLAYCLUB--2013-1
Conference
- Title
- NEA Clay Club Workshop on clay characterisation from nanoscopic to microscopic resolution
- Dates
- 6-8 Sep 2011
- Place
- Karlsruhe (Germany)
INIS
- Country of Publication
- Nuclear Energy Agency of the OECD (NEA)
- Country of Input or Organization
- Nuclear Energy Agency of the OECD (NEA)
- INIS RN
- 46109584
- Subject category
- S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGILLITE; ATOMIC FORCE MICROSCOPY; ION BEAMS; MECHANICAL POLISHING; PORE STRUCTURE; POROSITY; SCANNING ELECTRON MICROSCOPY; SPATIAL RESOLUTION; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- BEAMS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; MICROSCOPY; MICROSTRUCTURE; POLISHING; RESOLUTION; ROCKS; SCATTERING; SEDIMENTARY ROCKS; SHALES; SPECTROSCOPY; SURFACE FINISHING
Optional Information
- Notes
- 5 refs.