Published May 28, 2013 | Version v1
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Qualitative and Quantitative Characterization of Porosity in a Low Porous and Low Permeable Organic Rich Shale by Combining Broad Ion Beam and Scanning Electron Microscopy (BIB-SEM)

  • 1. Structural Geology, Tectonics and Geomechanics, RWTH Aachen University (Germany)

Description

This contribution focuses on the characterization of porosity in low porous shale using a broad ion beam (BIB) polishing technique combined with a conventional scanning electron microscopy (SEM). Porosity was traced in certain representative elementary areas (REA) and pores detected are segmented from mosaics of secondary electron (SE) images. Traced pores could be classified into two major pore-size classes. Relative large pores (> 0.5 μm2) were found in the organic matter and matrix. They contribute strongly to the overall porosity con-tent of the shale. Nevertheless the far majority of the pores traced have equivalent radius less than 400 nm. Including the latter pore class, the imaged porosity from both samples gives similar results in the order of < 1 %. (authors)

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Part of:
Proceedings of the NEA Clay Club Workshop on Clay characterisation from nanoscopic to microscopic resolution

Additional details

Publishing Information

Imprint Title
Proceedings of the NEA Clay Club Workshop on Clay characterisation from nanoscopic to microscopic resolution
Imprint Pagination
168 p.
Journal Page Range
p. 108-111
Report number
NEA-RWM-CLAYCLUB--2013-1

Conference

Title
NEA Clay Club Workshop on clay characterisation from nanoscopic to microscopic resolution
Dates
6-8 Sep 2011
Place
Karlsruhe (Germany)

INIS

Country of Publication
Nuclear Energy Agency of the OECD (NEA)
Country of Input or Organization
Nuclear Energy Agency of the OECD (NEA)
INIS RN
46109584
Subject category
S36: MATERIALS SCIENCE; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ARGILLITE; ATOMIC FORCE MICROSCOPY; ION BEAMS; MECHANICAL POLISHING; PORE STRUCTURE; POROSITY; SCANNING ELECTRON MICROSCOPY; SPATIAL RESOLUTION; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
Descriptors DEC
BEAMS; COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; MICROSCOPY; MICROSTRUCTURE; POLISHING; RESOLUTION; ROCKS; SCATTERING; SEDIMENTARY ROCKS; SHALES; SPECTROSCOPY; SURFACE FINISHING

Optional Information

Notes
5 refs.