Laser fluence and spot size effect on compositional and structural properties of BiFeO3 thin films grown by Pulsed Laser Deposition
Creators
- 1. Laboratoire GREMAN, UMR7347 CNRS Université François Rabelais, faculté de sciences et techniques, 37200 Tours (France)
- 2. Laboratoire CEMHTI, UPR3079 CNRS, Site Cyclotron, 45071 Orléans cedex 2 (France)
- 3. Laboratoire LPMC, Université Jules Vernes Picardie - Amiens (France)
- 4. CEA, DAM, Le Ripault, F-37260 Monts (France)
Description
We investigated the effect of laser fluence and spot size on the structure and composition of BiFeO3 (BFO) epitaxial thin films grown on SrTiO3 substrates by Pulsed Laser Deposition. X-ray diffraction shows that BFO's out of plane lattice parameter increases with the laser fluence. A coherent epitaxial film growth is observed for all tested laser fluences and spot sizes for thicknesses up to 16 nm. The critical thickness at which relaxation occurs depends either on the laser fluence or spot size. The fluence dependence of the out of plane lattice parameter is accompanied with a cationic composition variation. Bi vacancies are evidenced at lower fluences while as Bi/Fe tends towards 1 a higher relaxation critical thickness is observed. An optimum Bi/Fe ratio is obtained for a fluence of 1.72 J/cm2. This result was confirmed by wavelength-dispersive x-ray spectroscopy (WDS) scans over a 1 cm2 film. An excellent thickness and composition uniformity is attained over the entire sample area. - Highlights: • BiFeO3 films have been pulsed laser deposited using various laser fluences and spot sizes. • Bi/Fe ratio and out of plane lattice parameter correlate with laser fluence. • Critical thickness for film relaxation is increased for Bi/Fe = 1. • Excellent composition and thickness uniformity are demonstrated.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.tsf.2017.05.003Additional details
Identifiers
- DOI
- 10.1016/j.tsf.2017.05.003;
- PII
- S0040-6090(17)30327-9;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 634
- Journal Page Range
- p. 107-111
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49080614
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CRYSTAL GROWTH; DEPOSITS; ENERGY BEAM DEPOSITION; EPITAXY; LASER RADIATION; LATTICE PARAMETERS; OXIDES; PULSED IRRADIATION; PULSES; RELAXATION; STRONTIUM TITANATES; THICKNESS; THIN FILMS; X-RAY DIFFRACTION; X-RAY SPECTROSCOPY
- Descriptors DEC
- ALKALINE EARTH METAL COMPOUNDS; CHALCOGENIDES; COHERENT SCATTERING; CRYSTAL GROWTH METHODS; DEPOSITION; DIFFRACTION; DIMENSIONS; ELECTROMAGNETIC RADIATION; FILMS; IRRADIATION; OXYGEN COMPOUNDS; RADIATIONS; SCATTERING; SPECTROSCOPY; STRONTIUM COMPOUNDS; SURFACE COATING; TITANATES; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2017 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.