High-performance quasi-vertical GaN Schottky barrier diode with anode selective fluorine treatment
Creators
- 1. State Key Discipline Laboratory of Wide Band Gap Semiconductor Technology, School of Microelectronics, Xidian University, Xi'an 710071 (China)
- 2. Chengdu Yaguang Electronics Co., Ltd., Chengdu 610000 (China)
Description
In this letter, we report a high performance GaN quasi-vertical Schottky barrier diode (SBD) on sapphire substrate with a planar anode selective fluorine treatment (SFT). The presented SBD with anode SFT–SBD exhibits a large forward current density over 2 kA cm−2 and a low differential specific on-resistance of 0.49 mΩ cm2. Compared to the conventional SBD, the leakage current of SFT–SBD is suppressed over 4 orders of magnitude, leading to the breakdown voltage (BV) dramatically improved from 78 to 145 V, but without severe degradation of the on-state performance. The simulation results indicate that the anode SFT can effectively reduce the path of leakage current at reverse bias, leading to the suppressed leakage current thus enhanced BV. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1361-6641/ab420cAdditional details
Identifiers
Publishing Information
- Journal Title
- Semiconductor Science and Technology
- Journal Volume
- 34
- Journal Issue
- 11
- Journal Page Range
- [6 p.]
- ISSN
- 0268-1242
- CODEN
- SSTEET
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52037546
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ANODES; BREAKDOWN; COMPUTERIZED SIMULATION; CURRENT DENSITY; ELECTRIC POTENTIAL; FLUORINE; GALLIUM NITRIDES; LEAKAGE CURRENT; PERFORMANCE; SAPPHIRE; SCHOTTKY BARRIER DIODES; SUBSTRATES
- Descriptors DEC
- CORUNDUM; CURRENTS; ELECTRIC CURRENTS; ELECTRODES; ELEMENTS; GALLIUM COMPOUNDS; HALOGENS; MINERALS; NITRIDES; NITROGEN COMPOUNDS; NONMETALS; OXIDE MINERALS; PNICTIDES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SIMULATION