ARDESIA-16: a 16-channel SDD-based spectrometer for energy dispersive X-ray fluorescence spectroscopy
Creators
- 1. Dipartimento di Elettronica, Informazione e Bioingegneria DEIB, Politecnico di Milano, Via Giuseppe Ponzio, 34/5, 20133 Milano MI (Italy)
- 2. Trento Institute for Fundamental Physics Applications TIFPA, Via Sommarive, 14, 38123 Povo TN (Italy)
- 3. Dipartimento di Scienze del Suolo, della Pianta e degli Alimenti (Di.S.S.P.A.), Università degli Studi di Bari, Via Giovanni Amendola, 165/a, 70126 Bari BA (Italy)
- 4. Deutsches Elektronen-Synchrotron DESY, Notkestraße 85 22607 Hamburg (Germany)
Description
We present ARDESIA-16, an X-ray spectrometer based on a monolithic 16-element Silicon Drift Detector (SDD) matrix specifically designed for synchrotron applications. In this work, we describe the main design guidelines which we followed concerning the signal throughput, the energy efficiency, the energy resolution and the overall solid angle covered by detector elements. The characterization of the spectrometer has been made both with radioactive sources in a laboratory environment and with synchrotron light at the P06 beamline (DESY, Hamburg). Experimental results showed an average energy resolution at the optimum peaking time equal to 125 eV (FWHM at Mn Kα), a maximum achieved Output Count Rate (OCR) equal to 17 Mcps, an increase of the energy efficiency above 10 keV thanks to the 1 mm-thick SDD and an overall solid angle equal to 0.4 sr. Finally, we report the first X-ray fluorescence microscopy (XFM) images acquired with an ARDESIA spectrometer. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1748-0221/16/07/P07057Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Instrumentation
- Journal Volume
- 16
- Journal Issue
- 07
- Journal Page Range
- [13 p.]
- ISSN
- 1748-0221
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 53083384
- Subject category
- S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
- Descriptors DEI
- COUNTING RATES; DESIGN; ENERGY EFFICIENCY; ENERGY RESOLUTION; FLUORESCENCE; KEV RANGE; RADIATION SOURCES; SILICON; SOLIDS; X RADIATION; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROMETERS
- Descriptors DEC
- CHEMICAL ANALYSIS; EFFICIENCY; ELECTROMAGNETIC RADIATION; ELEMENTS; EMISSION; ENERGY RANGE; IONIZING RADIATIONS; LUMINESCENCE; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; PHOTON EMISSION; RADIATIONS; RESOLUTION; SEMIMETALS; SPECTROMETERS; X-RAY EMISSION ANALYSIS