Published July 1, 2021 | Version v1
Journal article

ARDESIA-16: a 16-channel SDD-based spectrometer for energy dispersive X-ray fluorescence spectroscopy

  • 1. Dipartimento di Elettronica, Informazione e Bioingegneria DEIB, Politecnico di Milano, Via Giuseppe Ponzio, 34/5, 20133 Milano MI (Italy)
  • 2. Trento Institute for Fundamental Physics Applications TIFPA, Via Sommarive, 14, 38123 Povo TN (Italy)
  • 3. Dipartimento di Scienze del Suolo, della Pianta e degli Alimenti (Di.S.S.P.A.), Università degli Studi di Bari, Via Giovanni Amendola, 165/a, 70126 Bari BA (Italy)
  • 4. Deutsches Elektronen-Synchrotron DESY, Notkestraße 85 22607 Hamburg (Germany)

Description

We present ARDESIA-16, an X-ray spectrometer based on a monolithic 16-element Silicon Drift Detector (SDD) matrix specifically designed for synchrotron applications. In this work, we describe the main design guidelines which we followed concerning the signal throughput, the energy efficiency, the energy resolution and the overall solid angle covered by detector elements. The characterization of the spectrometer has been made both with radioactive sources in a laboratory environment and with synchrotron light at the P06 beamline (DESY, Hamburg). Experimental results showed an average energy resolution at the optimum peaking time equal to 125 eV (FWHM at Mn Kα), a maximum achieved Output Count Rate (OCR) equal to 17 Mcps, an increase of the energy efficiency above 10 keV thanks to the 1 mm-thick SDD and an overall solid angle equal to 0.4 sr. Finally, we report the first X-ray fluorescence microscopy (XFM) images acquired with an ARDESIA spectrometer. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1748-0221/16/07/P07057

Additional details

Publishing Information

Journal Title
Journal of Instrumentation
Journal Volume
16
Journal Issue
07
Journal Page Range
[13 p.]
ISSN
1748-0221