Combined analysis of the S and W parameters obtained from positron annihilation spectra
Creators
- 1. Interfaculty Reactor Inst., Delft Univ. of Technology (Netherlands)
Description
Variable energy positron beam analysis (PBA) has proven to be a very useful and powerful technique for the study of nanosize layer structures and point defects in various materials. Analysis of the positron annihilation spectra is usually performed with the help of the S and W parameters. By mapping the experimental points in the S-W plane the cluster points characteristic for the layers or defects can be derived. We have developed the program SWAN (S-W analysis) to enable to trace these cluster points and to calculate the fractions of the positrons annihilated at the layers or defects ascribed to the cluster points. In combination with the known computer code VEPFIT, program SWAN was successfully used for analyzing the S and W- curves for a number of samples. As an example, the analysis of SIMOX sample measured by PBA is presented. The program runs on a PC, has a user-friendly interface and is available for distribution. (orig.)
Additional details
Publishing Information
- Journal Title
- Materials Science Forum
- Journal Volume
- 363-365
- Journal Page Range
- p. 646-648
- ISSN
- 0255-5476
- CODEN
- MSFOEP
Conference
- Title
- 12. international conference on positron annihilation
- Acronym
- ICPA-12
- Dates
- 6-12 Aug 2000
- Place
- Munich (Germany)
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- Switzerland
- INIS RN
- 32030909
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AGGLOMERATION; ANNIHILATION; DATA ANALYSIS; ENERGY DEPENDENCE; POINT DEFECTS; POSITRON BEAMS; SEMICONDUCTOR DEVICES; SILICON; SILICON OXIDES
- Descriptors DEC
- BEAMS; CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELEMENTS; INTERACTIONS; LEPTON BEAMS; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; PARTICLE INTERACTIONS; SEMIMETALS; SILICON COMPOUNDS
Optional Information
- Notes
- 3 refs.