Magnetic texture determination by conversion electron Moessbauer spectroscopy with circularly polarized beam
- 1. Faculty of Physics, University of Bialystok, 15-424 Bialystok (Poland)
- 2. The Soltan Institute for Nuclear Studies, 05-400 Otwock-Swierk (Poland)
- 3. KFKI Research Institute for Particle and Nuclear Physics, Budapest H-1525 P.O.B. 49 (Hungary)
Description
A new construction of a CEMS detector is presented. The detector is dedicated to resonant polarimetric studies of samples in an external magnetic field. The construction permits investigations at different angles of radiation with respect to the sample surface. A possibility of magnetic texture measurements using circularly polarized radiation is demonstrated. An average square of the cosine <(γm)2> and an average cosine <γm> were determined and compared with results of independent measurements of the magnetic field inhomogeneity by a Hall probe. CEMS measurements performed on an isotopically enriched sample show a substantial influence of thickness effects on the measured spectra. An appropriate correction for a saturation effect was proposed and tested
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2008.04.004Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2008.04.004;
- PII
- S0168-583X(08)00545-4;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 266
- Journal Issue
- 14
- Journal Page Range
- p. 3319-3324
- ISSN
- 0168-583X
- CODEN
- NIMBEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 40011950
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- CONSTRUCTION; CONSTRUCTION PERMITS; CORRECTIONS; ELECTRONS; MAGNETIC FIELDS; MOESSBAUER EFFECT; MONOCHROMATIC RADIATION; POLARIZED BEAMS; PROBES; SATURATION; SPECTRA; SURFACES; THICKNESS
- Descriptors DEC
- BEAMS; DIMENSIONS; ELECTROMAGNETIC RADIATION; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; LICENSES; RADIATIONS
Optional Information
- Copyright
- Copyright (c) 2008 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.