Annealing effect on thermal conductivity and microhardness of carbon nanotube containing Se80Te16Cu4 glassy composites
Creators
- 1. Department of Ceramic Engineering, Indian Institute of technology, Banaras Hindu University, Varanasi-221005 (India)
- 2. Department of Physics, Institute of Science, Banaras Hindu University, Varanasi (India)
Description
This study deals with the effect of thermal annealing on structural/microstructural, thermal and mechanical behavior of pristine Se80Te16Cu4 and carbon nanotubes (CNTs) containing Se80Te16Cu4 glassy composites. Pristine Se80Te16Cu4, 3 and 5 wt%CNTs-Se80Te16Cu4 glassy composites are annealed in the vicinity of glass transition temperature to onset crystallization temperature (340–380 K). X-ray diffraction (XRD) pattern revealed formation of polycrystalline phases of hexagonal CuSe and trigonal selenium. The indexed d-values in XRD patterns are in well conformity with the d-values obtained after the indexing of the ring pattern of selected area electron diffraction pattern of TEM images. The SEM investigation exhibited that the grain size of the CNTs containing Se80Te16Cu4 glassy composites increased with increasing annealing temperature and decreased at further higher annealing temperature. Thermal conductivity, microhardness exhibited a substantial increase with increasing annealing temperature of 340–360 K and slightly decreases for 380 K. The variation of thermal conductivity and microhardness can be explained by cross-linking formation and voids reduction. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/2053-1591/aaa681Additional details
Identifiers
Publishing Information
- Journal Title
- Materials Research Express (Online)
- Journal Volume
- 5
- Journal Issue
- 2
- Journal Page Range
- [8 p.]
- ISSN
- 2053-1591
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 51082668
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; CARBON NANOTUBES; COPPER SELENIDES; ELECTRON DIFFRACTION; GRAIN SIZE; MICROHARDNESS; SCANNING ELECTRON MICROSCOPY; SELENIUM TELLURIDES; THERMAL CONDUCTIVITY; TRANSITION TEMPERATURE; X-RAY DIFFRACTION
- Descriptors DEC
- CARBON; CHALCOGENIDES; COHERENT SCATTERING; COPPER COMPOUNDS; DIFFRACTION; ELECTRON MICROSCOPY; ELEMENTS; HARDNESS; HEAT TREATMENTS; MECHANICAL PROPERTIES; MICROSCOPY; MICROSTRUCTURE; NANOSTRUCTURES; NANOTUBES; NONMETALS; PHYSICAL PROPERTIES; SCATTERING; SELENIDES; SELENIUM COMPOUNDS; SIZE; TELLURIDES; TELLURIUM COMPOUNDS; THERMODYNAMIC PROPERTIES; TRANSITION ELEMENT COMPOUNDS