Nanomanipulation and electrical behaviour of a single gold nanowire using in-situ SEM-FIB-nanomanipulators
- 1. Department of Engineering Materials, Sheffield University, Sheffield S1 3JD (United Kingdom)
- 2. Department of Electronic and Electrical Engineering, Sheffield University, Sheffield S1 3JD (United Kingdom)
Description
Gold nanowires were successfully fabricated by a DC electrodeposition technique into Anodic Aluminium Oxide (AAO) templates. The microstructure of 55nm gold nanowires released from AAO templates was observed by SEM and TEM to be polycrystalline, with a bamboo-type structure and grain sizes 20nm to several micrometers. Individual gold nanowires were picked up from bundles of gold nanowires using a super-sharp W tip attached to an in-situ Kleindiek nanomanipulator fitted in a SEM-FIB. The picked-up gold nanowires were then deposited onto a silicon wafer, or connected between two nanomanipulator tips, to fabricate single nanowire nano-circuits for electrical testing. The electrical properties of single manipulated nanowires are compared to that of bundles of gold nanowires for the two circuit types. The lowest resistance is achieved by connecting the gold nanowires between two FIB-milled tungsten tips.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/126/1/012031Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 126
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- Electron Microscopy and Analysis Group (EMAG) conference 2007 - Characterisation, manipulation and fabrication on the nanoscale
- Acronym
- EMAG 2007
- Dates
- 3-7 Sep 2007
- Place
- Glasgow, Scotland (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 41036496
- Subject category
- S36: MATERIALS SCIENCE; S77: NANOSCIENCE AND NANOTECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALUMINIUM OXIDES; ELECTRIC CONDUCTIVITY; ELECTRICAL TESTING; ELECTRODEPOSITION; GOLD; GRAIN SIZE; ION BEAMS; POLYCRYSTALS; QUANTUM WIRES; SCANNING ELECTRON MICROSCOPY; SILICON; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN
- Descriptors DEC
- ALUMINIUM COMPOUNDS; BEAMS; CHALCOGENIDES; CRYSTALS; DEPOSITION; ELECTRICAL PROPERTIES; ELECTROLYSIS; ELECTRON MICROSCOPY; ELEMENTS; LYSIS; MATERIALS TESTING; METALS; MICROSCOPY; MICROSTRUCTURE; NANOSTRUCTURES; NONDESTRUCTIVE TESTING; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; REFRACTORY METALS; SEMIMETALS; SIZE; SURFACE COATING; TESTING; TRANSITION ELEMENTS