Published 2014 | Version v1
Miscellaneous

Evaluation of characteristic impedance of the electrode and its fabrication method in stripline-type BPMs

  • 1. High Energy Accelerator Research Organization (KEK), Accelerator Laboratory, Tsukuba, Ibaraki (Japan)

Description

A relationship between characteristic impedance and its fabrication method of the electrode edge in stripline-type beam potion monitors (SBPMs) was investigated on the basis of experiments and theoretical calculations. The upgrade of the SBPMs with higher accuracy and resolution in the beam-position measurement is strongly required in the Super KEK B-factory (SKEKB), which has been started in 2010 while the main development of the SBPMs is for the signal-detection system. Such SBPMs are widely used in order to precisely measure the transverse beam positions in linear accelerators. Although conventional SBPMs were first developed at the KEKB injector linac in 1995, the author has reconsidered the fabrication method with having higher mechanical accuracy. As a result it was found that the modification of the fabrication method clearly affected the characteristic impedance of the electrode. In this report, the modification of the fabrication method and its quantitative effect to the characteristic impedance are discussed in detail. (author)

Part of:
Proceedings of the 11th annual meeting of Particle Accelerator Society of Japan

Additional details

Publishing Information

Imprint Title
Proceedings of the 11th annual meeting of Particle Accelerator Society of Japan
Imprint Pagination
[1393 p.]
Journal Page Range
[5 p.]

Conference

Title
11. annual meeting of Particle Accelerator Society of Japan
Dates
8-12 Aug 2014
Place
Aomori (Japan)

INIS

Country of Publication
Japan
Country of Input or Organization
Japan
INIS RN
47011300
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
BEAM INJECTION; BEAM MONITORING; BEAM MONITORS; BEAM POSITION; ELECTRIC IMPEDANCE; ELECTRODES; ELECTRONS; FABRICATION; KEK LINAC; POSITRONS; STORAGE RINGS
Descriptors DEC
ACCELERATORS; ANTILEPTONS; ANTIMATTER; ANTIPARTICLES; ELEMENTARY PARTICLES; FERMIONS; IMPEDANCE; LEPTONS; LINEAR ACCELERATORS; MATTER; MEASURING INSTRUMENTS; MONITORING; MONITORS

Optional Information

Notes
5 refs., 5 figs., 1 tab.