Simple Tools for Characterization of Synchrotron Beam Flux, Energy Resolution and Stability
- 1. National Synchrotron Light Source, Brookhaven National Laboratory, Upton, NY 11973 (United States)
- 2. Australian Synchrotron, 800 Blackburn Rd, Clayton VIC 3168 (Australia)
Description
Flux is a simple yet key indicator of overall beamline alignment. For many synchrotron measurements, the energy resolution and reproducibility are important characteristics as well. However, many beamlines do not have diffractometers capable of measuring the energy resolution in the experimental hutches. For absolute flux measurements, we have found that thickness calibrated Si photodiodes make very convenient, robust detectors capable of handling a wide flux range. For measuring the energy resolution, we have developed a simple, portable instrument analyzer applicable to any beamline with a scanning monochromator. This same instrument is capable of measuring the energy stability and reproducibility as well. We have used these to characterize many of the beamlines on the NSLS X-ray ring, and will present the methods and our experience to date to demonstrate their usefulness.
Additional details
Identifiers
- DOI
- 10.1063/1.3463289;
Publishing Information
- Journal Title
- AIP Conference Proceedings
- Journal Volume
- 1234
- Journal Issue
- 1
- Journal Page Range
- p. 645-648
- ISSN
- 0094-243X
- CODEN
- APCPCS
Conference
- Title
- 10. international conference on radiation instrumentation
- Acronym
- SRI 2009
- Dates
- 27 Sep - 2 Oct 2009
- Place
- Melbourne (Australia)
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42003470
- Subject category
- S43: PARTICLE ACCELERATORS; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION; BEAMS; DIFFRACTOMETERS; ENERGY RESOLUTION; MONOCHROMATORS; NSLS; PHOTODIODES; STABILITY; SYNCHROTRON RADIATION SOURCES; SYNCHROTRONS; THICKNESS; X RADIATION
- Descriptors DEC
- ACCELERATORS; CYCLIC ACCELERATORS; DIMENSIONS; ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; MEASURING INSTRUMENTS; RADIATION SOURCES; RADIATIONS; RESOLUTION; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; SORPTION; SYNCHROTRON RADIATION SOURCES
Optional Information
- Notes
- (c) 2010 American Institute of Physics