Published December 31, 2014 | Version v1
Journal article

Experimental and simulative strain field investigation of nano- and microscratches on nanolaminated (Cr, Al)N coating

Creators

Description

Micro- and nanoscratches were made on a nanolaminated CrN/AlN coating under different loads and velocities. The remaining vertical strain fields under the scratches were determined by measuring the bilayer periods in cross-fracture images using scanning electron microscopy. These results were compared with the remaining vertical strain fields obtained from scratch simulations utilizing the strain-rate-dependent material properties examined in preliminary work. The effect of the friction coefficient and residual stress on the strain and stress fields was investigated using simulations. The experimental and simulated strain fields show good quantitative agreement for the nanoscratches. Furthermore, the appearance of fractures and microcracks under the scratches could be correlated with strong shear stresses in simulations during indenter overrun. This method and the results obtained enable the stress–strain fields of coatings under dynamic mechanical loads to be determined quantitatively. Additionally, the possibility of determining failure criterions using scratch tests enables the simulative prediction of a coating's resistivity under real loading conditions. - Highlights: • Micro- and nanoscratches were created on a nanolaminated CrN/AlN sample. • Vertical strains under the scratch were determined via scanning electron microscopy. • The results are compared with those of finite element simulations. • The appearance of lateral microcracks is correlated with strong shear stresses. • A previously reported stress–strain determination methodology is validated

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2014.10.095

Additional details

Identifiers

DOI
10.1016/j.tsf.2014.10.095;
PII
S0040-6090(14)01074-8;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
573
Journal Page Range
p. 33-40
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.