Published June 1986
| Version v1
Journal article
RBS data processing. 1: Analysis of non-stoichiometric targets
Description
A technique which allows the depth distribution of an N-elemental target composition from Rutherford backscattering spectra to be obtained is presented. Using this technique one can calculate the ratio of the atomic concentration of each element to the total atomic concentration at some depth. The depth scale is determined in atoms cm2. The contributions from all target constituents to the stopping of probe ions are taken into account. The stopping power is given by Bragg's rule. The individual RBS yields from N-1 constituents are required to apply the technique. (author)
Additional details
Publishing Information
- Journal Title
- Radiat. Eff.
- Journal Volume
- 88
- Journal Issue
- 3-4
- Series
- Radiat. Eff.
- Journal Page Range
- 277-288
- ISSN
- 0033-7579
- CODEN
- RAEFB
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- United Kingdom
- INIS RN
- 17081479
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- ARSENIC; CHEMICAL COMPOSITION; CROSS SECTIONS; DEPTH; IMPURITIES; RUTHERFORD SCATTERING; SILICON; SILICON OXIDES; SPATIAL DISTRIBUTION; SPECTRA UNFOLDING; STOPPING POWER; TARGETS
- Descriptors DEC
- CHALCOGENIDES; DATA PROCESSING; DIMENSIONS; DISTRIBUTION; ELASTIC SCATTERING; ELEMENTS; OXIDES; OXYGEN COMPOUNDS; SCATTERING; SEMIMETALS; SILICON COMPOUNDS