Published September 6, 1979
| Version v1
Patent
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Measuring assembly for X-ray fluorescence analysis
Description
For the measuring assembly plane specimens totally reflecting the X-radiation from their surface are used. In order to improve the comfort of handling the assembly and its applicability for serial examinations the specimens are arranged on a sample changer with a rotary plate revolving paraxially with respect to the detector axis. (DG)
Availability note (English)
MF available from INIS under the Report Number; Available from Deutsches Patentamt, Muenchen, Germany, F.R.Abstract (German)
Die Messanordnung verwendet plane Proben, an deren Oberflaeche Roentgenstrahlung totalreflektiert wird. Zur Erhoehung des Bedienungskomforts und der Verwendbarkeit fuer Reihenuntersuchungen sind die Proben auf einem Probenwechsler mit einem achsparallel zur Detektorachse verdrehbaren Karussel angeordnet. (DG)Files
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Additional details
Additional titles
- Original title (German)
- Messanordnung zur Roentgenfluoreszenzanalyse
Publishing Information
- Imprint Pagination
- 5 p.
- IPC:
- Int. Cl. G01N 23/223.
- IPC
- Int. Cl. G01N 23/223.
- Patent number
- DE patent document 2632001/B/
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 11555559
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Descriptors DEI
- REFLECTION; X-RAY FLUORESCENCE ANALYZERS