Published June 2014 | Version v1
Journal article

Biprism electron interferometry with a single atom tip source

  • 1. Institute of Physics and Center for Collective Quantum Phenomena in LISA
  • 2. Vienna Center for Quantum Science and Technology, TU Wien - Atominstitut, 1020 Vienna (Austria)
  • 3. Institute of Physics, Academia Sinica, Nankang, Taipei, Taiwan (China)

Description

Experiments with electron or ion matter waves require a coherent, monochromatic and long-term stable source with high brightness. These requirements are best fulfilled by single atom tip (SAT) field emitters. The performance of an iridium covered W(111) SAT is demonstrated and analyzed for electrons in a biprism interferometer. Furthermore we characterize the emission of the SAT in a separate field electron and field ion microscope and compare it with other emitter types. A new method is presented to fabricate the electrostatic charged biprism wire that separates and combines the matter wave. In contrast to other biprism interferometers the source and the biprism size are well defined within a few nanometers. The setup has direct applications in ion interferometry and Aharonov–Bohm physics. - Highlights: • The performance of a single atom tip is demonstrated in an electron interferometer. • The single atom tip emission is characterized in a field ion microscope. • A new method for the preparation of a biprism beam splitter is presented. • The electron emission of a single atom tip is studied in the time domain

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2014.02.003

Additional details

Identifiers

DOI
10.1016/j.ultramic.2014.02.003;
arXiv
arXiv:1311.7323v1;
PII
S0304-3991(14)00040-0;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
141
Journal Page Range
p. 9-15
ISSN
0304-3991
CODEN
ULTRD6

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.