Published December 2020 | Version v1
Book

A low-cost high quality neutron computed tomography system

  • 1. Heinz Maier-Leibnitz Zentrum (FRM II) and Physics E21, Technische Universität München, Lichtenbergstr.1, 85748 Garching (Germany)

Description

Using a new inexpensive scientific CMOS camera for astronomy, we have developed a compact minimalistic, but high-quality neutron detector with external shielding and variable field of view. The system can be fully integrated into a professional tomography system, but it can also be used for feasibility tests using a tomography controller based on a Raspberry Pi computer and cheap motion equipment. Using a matte screen and an optical light source, the system may even be used for teaching and training, and for testing the data processing chain. The considerations and details of the construction are presented. (author)

Part of:
Research Reactors: Addressing Challenges and Opportunities to Ensure Effectiveness and Sustainability. Summary of an International Conference. Supplementary Files

Additional details

Publishing Information

Publisher
IAEA
Imprint Place
Vienna (International Atomic Energy Agency (IAEA))
ISBN
978-92-0-131820-6
Imprint Title
Research Reactors: Addressing Challenges and Opportunities to Ensure Effectiveness and Sustainability. Summary of an International Conference. Supplementary Files
Imprint Pagination
vp.
Series
Proceedings Series
Journal Page Range
8 p.
ISSN
0074-1884

Conference

Title
Addressing Challenges and Opportunities to Ensure Effectiveness and Sustainability
Acronym
International Conference on Research Reactors
Dates
25-29 Nov 2019
Place
Buenos Aires (Argentina)

INIS

Country of Publication
International Atomic Energy Agency (IAEA)
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52011117
Subject category
S62: RADIOLOGY AND NUCLEAR MEDICINE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CAMERAS; CMOS CIRCUITS; COMPUTERIZED TOMOGRAPHY; COMPUTERS; COST BENEFIT ANALYSIS; DATA ANALYSIS; EDUCATIONAL TOOLS; MINIMIZATION; NEUTRON DETECTORS; NEUTRONS; SHIELDING; TESTING
Descriptors DEC
BARYONS; DATA PROCESSING; DIAGNOSTIC TECHNIQUES; ECONOMIC ANALYSIS; ECONOMICS; ELECTRONIC CIRCUITS; ELEMENTARY PARTICLES; FERMIONS; HADRONS; INTEGRATED CIRCUITS; MEASURING INSTRUMENTS; MICROELECTRONIC CIRCUITS; NUCLEONS; OPTIMIZATION; PROCESSING; RADIATION DETECTORS; TOMOGRAPHY

Optional Information

Notes
17 refs., 12 figs.; Presentation also available
Secondary number(s)
IAEA-CN--277/O.1.14