Published July 15, 1993
| Version v1
Journal article
Background recognition in Ge detectors by pulse shape analysis
Creators
- 1. Max-Planck-Institut fuer Kernphysik, Heidelberg (Germany)
- 2. Russian Scientific Center-Kurchatov Inst., Moscow (Russian Federation)
- 3. Lawrence Berkeley Lab., CA (United States)
Description
A method of event identification that distinguishes single and multiple-site events by determining the number of interactions in a high purity germanium detector is reported. The selectivity of the method has been experimentally verified. (orig.)
Additional details
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
- Journal Volume
- 332
- Journal Issue
- 1-2
- Journal Page Range
- p. 107-112.
- ISSN
- 0168-9002
- CODEN
- NIMAER
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- Netherlands
- INIS RN
- 24075506
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- BACKGROUND RADIATION; DISTRIBUTION FUNCTIONS; GAMMA DETECTION; GAMMA RADIATION; HIGH-PURITY GE DETECTORS; MEV RANGE 01-10; PARTICLE DISCRIMINATION; PROBABILITY; PULSE TECHNIQUES
- Descriptors DEC
- DETECTION; ELECTROMAGNETIC RADIATION; ENERGY RANGE; GE SEMICONDUCTOR DETECTORS; IONIZING RADIATIONS; MEASURING INSTRUMENTS; MEV RANGE; PARTICLE IDENTIFICATION; RADIATION DETECTION; RADIATION DETECTORS; RADIATIONS; SEMICONDUCTOR DETECTORS