Measurement of the thickness of a target deposited in a substrate

Being based on the Elastic scattering and in the Energy losses that suffer a projectile to the interacting with the matter, a method that allows to determine the thickness of a target deposited in a more heavy substrate is presented. The obtained results are consistent with that waited and the derived errors of the method are small. The used technique allows to reduce in considerable form the systematic errors coming from the calibration of the equipment. It is considered that this method is applicable in an interval of thickness quite wide and for many materials since it is only necessary to choose the projectile type and the energy of the same one appropriately. (Author)