Published April 1996
| Version v1
Journal article
Recent trends in single-event effect ground testing
Creators
- 1. Cert-Onera/Derts, Toulouse (France)
- 2. CNES, Toulouse (France)
Description
Single-event phenomena result from a single particle, heavy ion or proton, inducing transients in the sensitive volume of integrated circuits. Particle accelerators are used to simulate the space environment in order to perform a full characterization of the components. This paper describes the methods and facilities necessary for single-event effect (SEE) testing as well as recent trends observed in the device response to radiation
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Nuclear Science
- Journal Volume
- 43
- Journal Issue
- 2
- Journal Page Range
- p. 671-677.
- ISSN
- 0018-9499
- CODEN
- IETNAE
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 27057146
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- GROUND LEVEL; HEAVY ION ACCELERATORS; INTEGRATED CIRCUITS; IONIZING RADIATIONS; PHYSICAL RADIATION EFFECTS; RESPONSE FUNCTIONS; SIMULATION; SPACE FLIGHT; TEST FACILITIES; TESTING
- Descriptors DEC
- ACCELERATORS; ELECTRONIC CIRCUITS; FUNCTIONS; LEVELS; RADIATION EFFECTS; RADIATIONS