Functional control of microprocessors during radiation testing

Various methods of functional checks currently used in radiation testing of microprocessors are distinguished either by extremely low information density and reliability or an excessive time it takes to preparations and perform tests. The described method of the selective functional check is trade-off and ensures a sufficient fullness of microprocessor tests at reasonable expenses. The hardware and software base of the method is functional check unit, which is physically, functionally and parametrically optimized for performing radiation testing of almost all up-to-date microprocessors