Published June 2, 2008 | Version v1
Journal article

Experimental study of a radio-frequency Ionized Physical Vapour Deposition process: Contamination by the internal coil

  • 1. Laboratoire de Physique des Gaz et des Plasmas, Bat. 210, Universite Paris Sud, 91405 ORSAY Cedex (France)

Description

The Ionized Physical Vapour Deposition technique has been developed since 1990 as an improvement of the magnetron sputtering technique to obtain more conformal and dense deposited layers. Amongst the different methods developed to ensure the ionization of the sputtered vapour, the superimposition of an Inductively Coupled Plasma to a magnetron cathode is the most used method. However, the use of an internal radio-frequency (RF) coil to create the additional ionization may lead to contamination of the deposited layers by the material of the coil. We report in this paper a set of experiments that allowed us to control the film deposition pollution. We compared the flux of particles sputtered from the magnetron and deposited on the coil, with the flux of atoms sputtered by ions from the RF coil. In our experiments, the magnetron material is titanium and the coil material is stainless steel

Availability note (English)

Available from http://dx.doi.org/10.1016/j.tsf.2007.08.119

Additional details

Identifiers

DOI
10.1016/j.tsf.2007.08.119;
PII
S0040-6090(07)01471-X;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
516
Journal Issue
15
Journal Page Range
p. 4700-4708
ISSN
0040-6090
CODEN
THSFAP

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.