Published January 1, 2015 | Version v1
Journal article

Band offsets of novel CoTiO3/Ag3VO4 heterojunction measured by X-ray photoelectron spectroscopy

  • 1. Department of Chemistry, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand)
  • 2. Thai Microelectronics Center (TMEC), National Electronics and Computer Technology Center (NECTEC), Chachoengsao 24000 (Thailand)
  • 3. Materials Science Research Centre, Faculty of Science, Chiang Mai University, Chiang Mai 50200 (Thailand)

Description

Highlights: • Band lineup of novel CoTiO3/Ag3VO4 composite is determined by semidirect XPS method. • The composite forms a type-II staggered heterojunction. • Valence and conduction-band offsets are 0.2 ± 0.3 and −0.6 ± 0.3 eV, respectively. • Band lineup determination is needed for understanding charge transfer at interfaces. - Abstract: The energy band diagram and band offsets of the novel CoTiO3/Ag3VO4 heterojunction photocatalyst are investigated by X-ray photoelectron spectroscopy for the first time. Excluding the strain effect, the valence-band and conduction-band offsets are determined to be 0.2 ± 0.3 eV and −0.6 ± 0.3 eV, respectively. The CoTiO3/Ag3VO4 composite forms a type-II heterojunction, for which the photogenerated charge carriers could be effectively separated. The results suggest that determination of the energy band structure is crucial for understanding the photogenerated charge transfer mechanism at the interfaces, hence the corresponding photocatalytic activity and would also be beneficial to the design of new and efficient heterostructure-based photocatalysts

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2014.11.020

Additional details

Identifiers

DOI
10.1016/j.apsusc.2014.11.020;
PII
S0169-4332(14)02475-1;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
324
Journal Page Range
p. 705-709
ISSN
0169-4332
CODEN
ASUSEE

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.