Published March 1989 | Version v1
Journal article Metadata-only

Multi-fluxon dynamics in inhomogeneous Josephson junctions

Creators

  • 1. Institute of Solid State Physics, USSR Academy of Sciences, 142432 Chernogolovka, Moscow district (USSR)

Description

Long Josephson junctions Nb-NbO/sub x/-Pb with artificially formed SiO inhomgeneities in the insulator layer have been studied. A finest ture has been observed on the current - voltage characteristics of the junctions. Such structure is considered to be due to the resonance interaction between the fluxon and its radiation. Single-fluxon effect in zero magnetic field and multy-fluxon effect in large field have been studied experimentally. The results are compared with those of the perturbation theory and the numerical simulation. A multy-fluxon chain pinning effect observed in the commensurable lattice of inhomogeneities is reported and discussed

Additional details

Publishing Information

Journal Title
IEEE Transactions on Magnetics
Journal Volume
25
Journal Issue
2
Series
IEEE Trans. Magn.
Journal Page Range
1440-1443
ISSN
0018-9464
CODEN
IEMGA

Conference

Title
Applied superconductivity conference.
Dates
21-25 Aug 1988.
Place
San Francisco, CA (USA).

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
20070900
Subject category
S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference, Numerical Data
Descriptors DEI
DYNAMICS; EXPERIMENTAL DATA; JOSEPHSON JUNCTIONS; LATTICE PARAMETERS; LEAD; MAGNETIC FIELDS; MATRIX MATERIALS; NIOBIUM OXIDES; NUMERICAL SOLUTION; PERTURBATION THEORY; SILICON OXIDES; SUPERCONDUCTIVITY
Descriptors DEC
CHALCOGENIDES; DATA; ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELEMENTS; INFORMATION; MATERIALS; MECHANICS; METALS; NIOBIUM COMPOUNDS; NUMERICAL DATA; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SEMICONDUCTOR JUNCTIONS; SILICON COMPOUNDS; TRANSITION ELEMENT COMPOUNDS

Optional Information

Secondary number(s)
CONF-880812--.