Analysis of Lichen and Moss Samples by Using X-Ray Fluorescence Method
Creators
- 1. Flerov Laboratory of Nuclear Reactions, Joint Institute for Nuclear Research (Russian Federation)
- 2. Nuclear Physics Research Center, National University of Mongolia (Mongolia)
- 3. Institute Botanical Garden, Mongolian Academy of Sciences (Mongolia)
Description
As a result of intensive research conducted in recent years in many countries of the world on the selection of advanced analytical methods for continuous monitoring of environmental air pollution, representatives of non-vascular plants such as moss and lichen have been found to be suitable as bioindicators. XRFA method has advantages over other methods in terms of simultaneous determination of many elements, simple sample preparation, and good sensitivity [1]. Research results from many countries show that the method of energy-dispersive X-ray fluorescence analysis (EDXRF) is suitable for elemental analysis of biological and geological samples [2-6]. This study presents the results of determining the contents of K, Ca, Ti, Mn, Fe, Cu, Zn, Rb, Sr, and Pb by EDXRF in moss and lichen samples, collected in the territory of the city of Ulaanbaatar, Mongolia.
Additional details
Publishing Information
- ISBN
- 978-99929-53-93-4
- Imprint Title
- The 6th International Hybrid Conference on X-ray Analysis. Book of Abstracts
- Imprint Pagination
- 87 p.
- Journal Page Range
- p. 50-51
- Report number
- INIS-MN--002
Conference
- Title
- 6. International Conference on X-ray Analysis
- Acronym
- ICXRA-VI
- Dates
- 28-30 Aug 2023
- Place
- Ulaanbaatar (Mongolia)
INIS
- Country of Publication
- Mongolia
- Country of Input or Organization
- Mongolia
- INIS RN
- 54123972
- Subject category
- S54: ENVIRONMENTAL SCIENCES; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- AIR POLLUTION; CHEMICAL COMPOSITION; ELEMENTS; ENVIRONMENTAL EFFECTS; MONITORING; X-RAY FLUORESCENCE ANALYSIS; X-RAY SPECTROMETERS
- Descriptors DEC
- CHEMICAL ANALYSIS; MEASURING INSTRUMENTS; NONDESTRUCTIVE ANALYSIS; POLLUTION; SPECTROMETERS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 6 refs.
- Secondary number(s)
- INIS-MN--002-26