Published 1983 | Version v1
Journal article Metadata-only

On-line electronic system for a multilayer semiconductor spectrometer

Creators

  • 1. Joint Inst. for Nuclear Research, Dubna (USSR)

Description

A scheme and an electronic system for automatic data acquisition from a multilayer semiconductor spectrometer, to investigate pion absorption by nuclei, are described. The system performs a preliminary selection of events, registration of spectrometric data and status monitoring of the facility. Information communicated to the ES-1030 computer for final processing. The system considered operated all-in-all for 250 h. The system performance is found comply with all the requirements necessary for conducting similar experiments. The principle of the system operation assures a possibility of its further extension as well as execution of additional functions on tuning and calibration without essential changes to configuration and software

Additional details

Additional titles

Original title (Russian)
Автоматизированная электронная система многослойного полупроводникового спектрометра

Publishing Information

Journal Title
Prib. Tekh. Ehksp.
Journal Issue
no.5
Series
Prib. Tekh. Ehksp.
ISSN
0032-8162

INIS

Country of Publication
Russian Federation
Country of Input or Organization
USSR
INIS RN
16014979
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Descriptors DEI
CALIBRATION; CAMAC SYSTEM; COINCIDENCE CIRCUITS; DATA ACQUISITION SYSTEMS; DATA TRANSMISSION; DELAY CIRCUITS; ENERGY RESOLUTION; ES COMPUTERS; FLOWSHEETS; LI-DRIFTED SI DETECTORS; LOGIC CIRCUITS; MULTIPARTICLE SPECTROMETERS; ON-LINE MEASUREMENT SYSTEMS; STABILITY; TELESCOPE COUNTERS
Descriptors DEC
COMMUNICATIONS; COMPUTERS; DIAGRAMS; ELECTRONIC CIRCUITS; INFORMATION; LI-DRIFTED DETECTORS; MEASURING INSTRUMENTS; ON-LINE SYSTEMS; RADIATION DETECTORS; RESOLUTION; SEMICONDUCTOR DETECTORS; SI SEMICONDUCTOR DETECTORS; SPECTROMETERS

Optional Information

Notes
For English translation see the journal Instruments and Experimental Techniques (USA).