Characterization of CdMnTe films deposited from polycrystalline powder source using closed-space sublimation method

CdMnTe films were prepared on quartz substrates by closed-space sublimation of polycrystalline Cd_0.74Mn_0.26Te powders. This was performed at different substrate temperatures (T_s = 200, 300, 350, and 400 °C). The interfacial adhesion strength between the films and substrates, when fabricated from polycrystalline powders, was greater than that of films grown using a bulk source. X-ray diffraction studies revealed that the as-deposited films had a zinc blende structure with a preferential (111) orientation. Precipitation of Te occurred in the films deposited at T_s = 200 °C, as confirmed using scanning electron microscopy, x-ray diffraction, and Raman spectroscopy. The growth mode and re-evaporation dependence on the value of T_s of the films were investigated. Our results suggested that materials suitable for radiation detection can be grown from a powder source at lower substrate temperatures then when grown from a bulk source