Performance of plastic electron optics components fabricated using a 3D printer
Creators
- 1. Department of Physics and Astronomy, The University of Nebraska, Lincoln, Nebraska, 68588-0299 (United States)
Description
Highlights: • 3D-printed plastic electron optics elements work in vacuum. • Plastic electron optics are predicted to provide sub-100 nm foci. • A plastic and non-metal coated quadrupole and deflector are demonstrated. • Potential cost reducing step for environmental electron microscopes. -- Abstract: We show images produced by an electron beam deflector, a quadrupole lens and a einzel lens fabricated from conducting and non-conducting plastic using a 3D printer. Despite the difficulties associated with the use of plastics in vacuum, such as outgassing, poor conductivity, and print defects, the devices were used successfully in vacuum to steer, stretch and focus electron beams to millimeter diameters. Simulations indicate that much smaller focus spot sizes might be possible for such 3D-printed plastic electron lenses taking into account some possible surface defects. This work was motivated by our need to place electron optical components in difficult-to-access geometries. Our proof-of-principle demonstration opens the door to consider 3D-printed electron microscopes, whose reduced cost would make such microscopes more widely available. Potentially, this may have a significant impact on electron beam science and technology in general and electron microscopy in particular.
Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2019.05.013;
- PII
- S0304399118303206;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 205
- Journal Page Range
- p. 70-74
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 55050740
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- 3D PRINTING; COMPUTERIZED SIMULATION; ELECTRON BEAMS; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRONS; GEOMETRY; OPTICS; PLASTICS
- Descriptors DEC
- BEAMS; COMPUTER-AIDED FABRICATION; ELEMENTARY PARTICLES; FABRICATION; FERMIONS; LEPTON BEAMS; LEPTONS; MATERIALS; MATHEMATICS; MICROSCOPES; MICROSCOPY; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PARTICLE BEAMS; PETROCHEMICALS; PETROLEUM PRODUCTS; POLYMERS; SIMULATION; SYNTHETIC MATERIALS
Optional Information
- Copyright
- Copyright (c) 2019 Elsevier B.V. All rights reserved.