Published December 13, 2013
| Version v1
Journal article
Modification of LiF structure by irradiation with swift heavy ions under oblique incidence
Creators
- 1. Institute of Solid State Physics, University of Latvia, Riga (Latvia)
- 2. GSI Helmholtz Centre, Planckstr 1, 64291 Darmstadt (Germany)
- 3. L.N. Gumilyov Eurasian National University, Astana (Kazakhstan)
- 4. Institute of Nuclear Physics (Kazakhstan)
Description
The structural modifications of LiF irradiated with swift heavy ions under oblique angles have been investigated using AFM, SEM, chemical etching, nanoindentation and optical absorption spectroscopy. LiF crystals were irradiated under incidence angles of 30 and 70 degrees with 2.2 GeV Au (fluence 57×l011 ions-cm2) and 150 MeV Kr ions (fluence 1012–1014 ions·cm−2). Structural study on sample cross-sections shows that two damage regions – (1) nanostructured zone and (2) dislocation – rich zone, which are typical for irradiations at normal incidence, appear also in samples irradiated under oblique angles. However in the latter case a more complex structure is formed that leads to stronger ion-induced hardening
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/49/1/012011Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 49
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1757-899X
Conference
- Title
- International conference on functional materials and nanotechnologies 2013
- Dates
- 21-24 Apr 2013
- Place
- Tartu (Estonia)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47047124
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ABSORPTION SPECTROSCOPY; ATOMIC FORCE MICROSCOPY; CROSS SECTIONS; CRYSTALS; DAMAGE; DISLOCATIONS; ETCHING; GEV RANGE; GEV RANGE 01-10; HARDENING; HEAVY IONS; INCIDENCE ANGLE; IRRADIATION; KRYPTON IONS; LITHIUM FLUORIDES; MEV RANGE 100-1000; MODIFICATIONS; NANOSTRUCTURES; SCANNING ELECTRON MICROSCOPY
- Descriptors DEC
- ALKALI METAL COMPOUNDS; CHARGED PARTICLES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRON MICROSCOPY; ENERGY RANGE; FLUORIDES; FLUORINE COMPOUNDS; GEV RANGE; HALIDES; HALOGEN COMPOUNDS; IONS; LINE DEFECTS; LITHIUM COMPOUNDS; LITHIUM HALIDES; MEV RANGE; MICROSCOPY; SPECTROSCOPY; SURFACE FINISHING