Published December 2008 | Version v1
Journal article

Ssr-marker analysis of the high protein content mutants of wheat by ion beam implantation

  • 1. Henan Provincial Laboratory of Ion Bean Bioengineering, Zhengzhou University, Zhengzhou, Henan (China)
  • 2. College of Life Sciences Luoyang, Normal University, Luoyang, Henan (China)

Description

Wheat was implanted by ion beam and its mutant offspring plants were obtained through field selections and protein determination in the sixth generation. The mutants were with characteristic of high-protein content and dwarf. The mutants were analyzed by using SSR marker. Deletion, substitution of SSR various amplification products occured in two SSR loci in the mutants. Comparing the sequence of mutants and CK, one mutant showed low degree of sequence homology. Using BLASTn, the sequence shared 95% homology with DNA part of BAC clone in Triticum aestivum and A genome HMW glutenin in Triticum turgidum. All the results suggested that implantation of ion beam could cause DNA recombination that might be the causation of the high-protein mutant. (authors)

Additional details

Publishing Information

Journal Title
Acta Agriculturae Nucleatae Sinica
Journal Volume
22
Journal Issue
6
Journal Page Range
p. 745-749
ISSN
1000-8551

Optional Information

Notes
5 figs., 1 tab., 16 refs.