Published November 2019 | Version v1
Journal article

Geometrical effect in the measurement of the CXRS on EAST

  • 1. Institute of Plasma Physics, Chinese Academy of Sciences, Hefei 230031 (China)
  • 2. School of Electrical Engineering, University of South of China, Hengyang, 420001 (China)
  • 3. Department of Nuclear Engineering, Seoul National University, Seoul, 151-742 (Korea, Republic of)
  • 4. Department of Engineering and Applied Physics, University of Science and Technology of China, Hefei 230026 (China)

Description

Charge eXchange Recombination Spectroscopy (CXRS) systems have been successfully applied on EAST since 2014. However, geometrical effects will deteriorate the diagnostic locality and introduce uncertainties into the measurement. A simplified spatial average model for the average of effective integral paths and an upgraded simulation of spectra (SOS) code are both used to evaluate these geometrical effects. The results show that spatial averaging effect with one beam can introduce up to 10% relative error in the ion temperature and velocity measurement at ITB region. Simultaneous injection of two beams can produce 20% uncertainties in core CXRS with single gaussian description of the spectra. To reduce the error, the spatial averaged position ρav calculated from the simplified model and a double gaussians fitting with a constrained intensity ratio model are applied in the CXRS data analysis, and the fitting results show a good consistency with the input profiles.

Additional details

Identifiers

DOI
10.1016/j.fusengdes.2019.111282;
PII
S0920379619307604;

Publishing Information

Journal Title
Fusion Engineering and Design
Journal Volume
148
Journal Page Range
vp.
ISSN
0920-3796
CODEN
FEDEEE

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
55104065
Subject category
S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
Descriptors DEI
CHARGE EXCHANGE; CHARGED-PARTICLE TRANSPORT; DATA ANALYSIS; ION TEMPERATURE
Descriptors DEC
DATA PROCESSING; PROCESSING; RADIATION TRANSPORT

Optional Information

Copyright
Copyright (c) 2019 Elsevier B.V. All rights reserved.