Fabrication of a solar cell from silicon doped with aluminium
- 1. Nanosciences African Network (NANOAFNET), iThemba LABS-National Research Foundation, 1 Old Faure Road, Somerset West 7129, PO Box 722, Somerset West, Western Cape (South Africa)
- 2. UNESCO-UNISA Africa Chair in Nanosciences-Nanotechnology, College of Graduate Studies, University of South Africa, Muckleneuk Ridge, PO Box 392, Pretoria (South Africa)
- 3. Physics Department, University of the Western Cape, Private Bag X 17, Bellville, 7535 (South Africa)
Description
In this study thin films of p-doped silicon were deposited on glass substrate using the hot wire chemical vapour deposition. The deposition chamber of the hot wire chemical vapour deposition was modified such that co-evaporation of the doping metal could be possible. This resulted in the p-doped silicon film, which also has a polycrystalline microstructure. Aluminium metal was used as a dopant instead of the conventional boron. To grow a silicon crystalline p-layer using this method, physical evaporation of aluminium in the hot-wire chemical vapor deposition chamber takes place, while at the same time catalytically fragmenting silane gas on the resistively heated tantulum hot wire. The microstructure (which is polycrystalline) and the electrical characterization of the p-type doping film will be presented in this work. This layer was then used to manufacture n–i–p prototype solar cell. The open circuit voltage (Voc) and the closed circuit current (Jsc) of the solar cell will also be presented in this study. - Graphical abstract: Real-time thermal RBS spectrometry spectra of a film prepared by doping silicon with aluminum using both physical and chemical vapour deposition in a single reaction chamber. Thermal stability of the grown doped polycrystalline film was tested using the in-situ Rutherford backscattering spectrometry. The temperature was ramped up to 375 °C at the ramp rate of 1 °C/min while collecting spectrum every 2 s. Only selected spectra are plotted to show the stability of the film. From this results it can be concluded that the aluminium incorporated in the silicon film is not migrating nor diffusing in the film due to thermal effects. - Highlights: • Crystallization and p-doping. • Thermally stable p-layer. • Prototype solar cell.
Availability note (English)
Available from http://dx.doi.org/10.1016/j.jallcom.2015.07.293Additional details
Identifiers
- DOI
- 10.1016/j.jallcom.2015.07.293;
- PII
- S0925-8388(15)30691-5;
Publishing Information
- Journal Title
- Journal of Alloys and Compounds
- Journal Volume
- 651
- Journal Page Range
- p. 121-125
- ISSN
- 0925-8388
- CODEN
- JALCEU
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 49048693
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ALUMINIUM COMPOUNDS; CHEMICAL VAPOR DEPOSITION; DEPOSITS; DOPED MATERIALS; MICROSTRUCTURE; POLYCRYSTALS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILICON COMPOUNDS; SOLAR CELLS; SPECTRA; TEMPERATURE DEPENDENCE; THIN FILMS
- Descriptors DEC
- CHEMICAL COATING; CRYSTALS; DEPOSITION; DIRECT ENERGY CONVERTERS; EQUIPMENT; FILMS; MATERIALS; PHOTOELECTRIC CELLS; PHOTOVOLTAIC CELLS; SOLAR EQUIPMENT; SPECTROSCOPY; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.