Published January 8, 2014 | Version v1
Journal article

Structure of the twofold surface of the icosahedral Ag–In–Yb quasicrystal

  • 1. Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai, 980-8577 (Japan)
  • 2. Surface Science Research Centre and Department of Physics, The University of Liverpool, Liverpool L69 3BX (United Kingdom)
  • 3. National Institute for Materials Science, 1-2-1 Sengen, Tsukuba, Ibaraki, 305-0047 (Japan)
  • 4. Institut Jean Lamour, UMR 7198 CNRS—Université de Lorraine, Parc de Saurupt, F-54011 Nancy Cedex (France)

Description

The structure of the twofold surface of the icosahedral (i-)Ag–In–Yb quasicrystal has been investigated using low energy electron diffraction (LEED) and scanning tunneling microscopy (STM). The LEED confirms that the surface exhibits quasicrystalline long range order with the twofold rotational symmetry expected from the bulk. STM images reveal a step–terrace structure with terrace size comparable to that of the other high symmetry surfaces of the same quasicrystal. The distribution of step heights and high resolution STM images of terraces suggest that the surface terminates at bulk planes that intersect the center of rhombic triacontahedral clusters, the building blocks of the system, as in the case of the threefold and fivefold surfaces of the system. These planes are rich in Yb and In. No facets are observed on the surface, suggesting that the twofold surface is as stable as the other high symmetry surfaces. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/0953-8984/26/1/015001

Additional details

Publishing Information

Journal Title
Journal of Physics. Condensed Matter
Journal Volume
26
Journal Issue
1
Journal Page Range
[6 p.]
ISSN
0953-8984
CODEN
JCOMEL

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46035561
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
COMPARATIVE EVALUATIONS; ELECTRON DIFFRACTION; HEIGHT; IMAGES; RESOLUTION; SCANNING TUNNELING MICROSCOPY; SURFACES; SYMMETRY
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; DIMENSIONS; EVALUATION; MICROSCOPY; SCATTERING