Published May 15, 2011 | Version v1
Journal article

Layer-by-layer deposition of Ti-4,4'-oxydianiline hybrid thin films

  • 1. Laboratory of Inorganic Chemistry, Department of Chemistry, Aalto University, FI-00076 Aalto (Finland)

Description

Features of the two thin-film techniques, atomic layer deposition (ALD) and molecular layer deposition (MLD), are combined to build up a stable novel inorganic-organic hybrid material of the (-Ti-N-C6H4-O-C6H4-N-)n type, deposited from successive pulses of TiCl4 and 4,4'-oxydianiline precursors. Depositions in the temperature range of 160-230 deg. C resulted in unstable films, while the films obtained in the temperature range of 250-490 deg. C were found stable in atmospheric air. The growth rate increased with increasing temperature, from 0.3 A per cycle at 160 deg. C to 1.1 A per cycle at 490 deg. C.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2011.02.022

Additional details

Identifiers

DOI
10.1016/j.apsusc.2011.02.022;
PII
S0169-4332(11)00213-3;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
257
Journal Issue
15
Journal Page Range
p. 6435-6439
ISSN
0169-4332
CODEN
ASUSEE

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.