Published December 1972 | Version v1
Journal article

Neutron-irradiation effects on microwave transistor amplifiers

Description

Studies are presented of neutron irradiation effects on microwave bipolar transistors in two applications--small signal, low noise amplifiers and large signal, power amplifiers. In both applications microwave transistors are found to be neutron tolerant. In the low noise case, the amplifier noise figure increases by less than 1 dB after a neutron fluence of 2 × 1015 n/cm2 (E > 10 keV). The observed degradation in noise figure is related both theoretically and experimentally to neutron-induced decreases in DC and low frequency current gain, and good agreement is found. In the power amplifier case, saturated output power and power gain decrease by 1.8 and 3 dB, respectively, after 2 × 1015 n/cm2. The change in saturated output power is related to increased high frequency Vce(sat), while the decreased gain is due to decreased high frequency current gain. Neutron effects on these transistor parameters are calculated from the power output and gain data, and compared with radiation effects on these parameters at low frequencies.

Additional details

Identifiers

Publishing Information

Journal Title
IEEE Transactions on Nuclear Science
Journal Volume
19
Journal Issue
6
Series
IEEE (Inst. Elec. Electron. Eng.), Trans. Nucl. Sci.
Journal Page Range
340-343
ISSN
0018-9499

Conference

Title
Annual conference on nuclear and space radiation effects.
Dates
24 Jul 1972.
Place
Seattle, Washington, USA.

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
4077262
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
MICROWAVE RADIATION; NEUTRONS; PHYSICAL RADIATION EFFECTS; TRANSISTOR AMPLIFIERS
Descriptors DEC
AMPLIFIERS; BARYONS; ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; ELEMENTARY PARTICLES; FERMIONS; HADRONS; NUCLEONS; RADIATION EFFECTS; RADIATIONS

Optional Information

Notes
See CONF-720707--.; Updated automatically by Metadata and Full-Text Enrichment Agent