Published August 26, 2007 | Version v1
Report

EFFECTIVENESS OF ELECTROSTATIC SHIELDING AND ELECTRONIC SUBTRACTION TO CORRECT FOR THE HOLE TRAPPING IN CDZNTE SEMICONDUCTOR DETECTORS

Description

CdZnTe (CZT) is a very promising material for nuclear-radiation detectors. CZT detectors operate at ambient temperatures and offer high detection efficiency and excellent energy resolution, placing them ahead of high-purity Ge for those applications where cryogenic cooling is problematic. The progress achieved in CZT detectors over the past decade is founded on the developments of robust detector designs and readout electronics, both of which helped to overcome the effects of carrier trapping. Because the holes have low mobility, only electrons can be used to generate signals in thick CZT detectors, so one must account for the variation of the output signal versus the locations of the interaction points. To obtain high spectral resolution, the detector's design should provide a means to eliminate this dependence throughout the entire volume of the device. In reality, the sensitive volume of any ionization detector invariably has two regions. In the first, adjacent to the collecting electrode, the amplitude of the output signal rapidly increases almost to its maximum as the interaction point is located farther from the anode; in the rest of the volume, the output signal remains nearly constant. Thus, the quality of CZT detector designs can be characterized based on the magnitude of the signals variations in the drift region and the ratio between the volumes of the driR and induction regions. The former determines the ''geometrical'' width of the photopeak i.e., the line width that affects the total energy resolution and is attributed to the device's geometry when all other factors are neglected. The latter determines the photopeak efficiency and the area under the continuum in the pulse-height spectra. In this work, we describe our findings from systematizing different designs of CZT detectors and evaluating their performance based on these two criteria

Additional details

Publishing Information

Imprint Pagination
vp.
Report number
BNL--77679-2007-CP

Conference

Title
SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING, 2007
Dates
26-30 Aug 2007
Place
SAN DIEGO, CA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
39004756
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
Conference, Non-conventional Literature
Descriptors DEI
CADMIUM ALLOYS; CDTE SEMICONDUCTOR DETECTORS; DESIGN; ELECTROSTATICS; HOLES; PERFORMANCE; SHIELDING; TELLURIUM ALLOYS; TRAPPING; ZINC ALLOYS
Descriptors DEC
ALLOYS; MEASURING INSTRUMENTS; RADIATION DETECTORS; SEMICONDUCTOR DETECTORS

Optional Information

Contract/Grant/Project number
NN2001030; AC02-98CH10886
Funding organization
DS (US)