Breaking the Crowther limit: Combining depth-sectioning and tilt tomography for high-resolution, wide-field 3D reconstructions
Creators
- 1. School of Applied and Engineering Physics and Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY 14853 (United States)
- 2. National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)
- 3. Department of Physics, Cornell University, Ithaca, NY 14853 (United States)
- 4. Department of Chemistry and Chemical Biology, Cornell University, Ithaca, NY 14853 (United States)
Description
To date, high-resolution (<1 nm) imaging of extended objects in three-dimensions (3D) has not been possible. A restriction known as the Crowther criterion forces a tradeoff between object size and resolution for 3D reconstructions by tomography. Further, the sub-Angstrom resolution of aberration-corrected electron microscopes is accompanied by a greatly diminished depth of field, causing regions of larger specimens (>6 nm) to appear blurred or missing. Here we demonstrate a three-dimensional imaging method that overcomes both these limits by combining through-focal depth sectioning and traditional tilt-series tomography to reconstruct extended objects, with high-resolution, in all three dimensions. The large convergence angle in aberration corrected instruments now becomes a benefit and not a hindrance to higher quality reconstructions. A through-focal reconstruction over a 390 nm 3D carbon support containing over 100 dealloyed and nanoporous PtCu catalyst particles revealed with sub-nanometer detail the extensive and connected interior pore structure that is created by the dealloying instability. - Highlights: • Develop tomography technique for high-resolution and large field of view. • We combine depth sectioning with traditional tilt tomography. • Through-focal tomography reduces tilts and improves resolution. • Through-focal tomography overcomes the fundamental Crowther limit. • Aberration-corrected becomes a benefit and not a hindrance for tomography
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2014.01.013Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2014.01.013;
- arXiv
- arXiv:1402.0028v1;
- PII
- S0304-3991(14)00023-0;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 140
- Journal Page Range
- p. 26-31
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46023915
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CARBON; CATALYSTS; DEPTH; ELECTRON MICROSCOPES; NANOPARTICLES; PORE STRUCTURE; RESOLUTION; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- DIAGNOSTIC TECHNIQUES; DIMENSIONS; ELECTRON MICROSCOPY; ELEMENTS; MICROSCOPES; MICROSCOPY; MICROSTRUCTURE; NONMETALS; PARTICLES
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.