Published May 2014 | Version v1
Journal article

Breaking the Crowther limit: Combining depth-sectioning and tilt tomography for high-resolution, wide-field 3D reconstructions

  • 1. School of Applied and Engineering Physics and Kavli Institute at Cornell for Nanoscale Science, Cornell University, Ithaca, NY 14853 (United States)
  • 2. National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)
  • 3. Department of Physics, Cornell University, Ithaca, NY 14853 (United States)
  • 4. Department of Chemistry and Chemical Biology, Cornell University, Ithaca, NY 14853 (United States)

Description

To date, high-resolution (<1 nm) imaging of extended objects in three-dimensions (3D) has not been possible. A restriction known as the Crowther criterion forces a tradeoff between object size and resolution for 3D reconstructions by tomography. Further, the sub-Angstrom resolution of aberration-corrected electron microscopes is accompanied by a greatly diminished depth of field, causing regions of larger specimens (>6 nm) to appear blurred or missing. Here we demonstrate a three-dimensional imaging method that overcomes both these limits by combining through-focal depth sectioning and traditional tilt-series tomography to reconstruct extended objects, with high-resolution, in all three dimensions. The large convergence angle in aberration corrected instruments now becomes a benefit and not a hindrance to higher quality reconstructions. A through-focal reconstruction over a 390 nm 3D carbon support containing over 100 dealloyed and nanoporous PtCu catalyst particles revealed with sub-nanometer detail the extensive and connected interior pore structure that is created by the dealloying instability. - Highlights: • Develop tomography technique for high-resolution and large field of view. • We combine depth sectioning with traditional tilt tomography. • Through-focal tomography reduces tilts and improves resolution. • Through-focal tomography overcomes the fundamental Crowther limit. • Aberration-corrected becomes a benefit and not a hindrance for tomography

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2014.01.013

Additional details

Identifiers

DOI
10.1016/j.ultramic.2014.01.013;
arXiv
arXiv:1402.0028v1;
PII
S0304-3991(14)00023-0;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
140
Journal Page Range
p. 26-31
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46023915
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
CARBON; CATALYSTS; DEPTH; ELECTRON MICROSCOPES; NANOPARTICLES; PORE STRUCTURE; RESOLUTION; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
DIAGNOSTIC TECHNIQUES; DIMENSIONS; ELECTRON MICROSCOPY; ELEMENTS; MICROSCOPES; MICROSCOPY; MICROSTRUCTURE; NONMETALS; PARTICLES

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.